scholarly journals A Physic-Based Explicit Compact Model for Reconfigurable Field-Effect Transistor

IEEE Access ◽  
2021 ◽  
pp. 1-1
Author(s):  
Wangze Ni ◽  
Zhen Dong ◽  
Bairun Huang ◽  
Yichi Zhang ◽  
Zhuojun Chen
Keyword(s):  
Field Effect ◽  
Field Effect Transistor ◽  
Compact Model ◽  
Effect Transistor

A Large-Signal Monolayer Graphene Field-Effect Transistor Compact Model for RF-Circuit Applications

2017 ◽  
Vol 64 (10) ◽  
pp. 4302-4309 ◽  
Author(s):  
Jorge-Daniel Aguirre-Morales ◽  
Sebastien Fregonese ◽  
Chhandak Mukherjee ◽  
Wei Wei ◽  
Henri Happy ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistor ◽  
Compact Model ◽  
Monolayer Graphene ◽  
Large Signal ◽  
Graphene Field Effect Transistor ◽  
Effect Transistor ◽  
Rf Circuit

Unified compact model for the ballistic quantum wire and quantum well metal-oxide-semiconductor field-effect-transistor

2003 ◽  
Vol 94 (2) ◽  
pp. 1061-1068 ◽  
Author(s):  
D. Jiménez ◽  
J. J. Sáenz ◽  
B. Iñı́quez ◽  
J. Suñé ◽  
L. F. Marsal ◽  
...  
Keyword(s):  
Quantum Well ◽  
Metal Oxide ◽  
Quantum Wire ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Metal Oxide Semiconductor ◽  
Compact Model ◽  
Oxide Semiconductor ◽  
Effect Transistor

Analytical Compact Model of Ballistic Cylindrical Nanowire Metal–Oxide–Semiconductor Field-Effect Transistor

2010 ◽  
Vol 49 (4) ◽  
pp. 04DN05 ◽  
Author(s):  
Tatsuhiro Numata ◽  
Shigeyasu Uno ◽  
Kazuo Nakazato ◽  
Yoshinari Kamakura ◽  
Nobuya Mori
Keyword(s):  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Metal Oxide Semiconductor ◽  
Compact Model ◽  
Oxide Semiconductor ◽  
Effect Transistor

scholarly journals A Systematic Compact Model Parameter Calibration with Adaptive Pattern Search Algorithm

2021 ◽  
Vol 11 (9) ◽  
pp. 4155
Author(s):  
Jeesoo Chang ◽  
Sungmin Hwang ◽  
Kyungchul Park ◽  
Taejin Jang ◽  
Kyung-Kyu Min ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistor ◽  
Search Algorithm ◽  
Pattern Search ◽  
Compact Model ◽  
Parameter Calibration ◽  
Pattern Search Algorithm ◽  
Effect Transistor ◽  
Calibration Time ◽  
Adaptive Pattern

A systematic device-model calibration (extraction) methodology has been proposed to reduce parameter calibration time of advanced compact model for modern nano-scale semiconductor devices. The adaptive pattern search algorithm is a variant of the direct search method, which explore in the parameter space with adaptive searching step and direction. It is very straightforward, but powerful, in high dimensional optimization problem since adaptive step and direction are decided by simple computation. The proposed method iterates less but shows superior accuracy over the conventional method. It is possible to be applied to a behavioral or empirical model correspond to emerging devices, such as tunneling field-effect transistor (TFET) and negative capacitance field-effect transistor (NCFET) due to its universality in parameter calibration for the model accuracy.

Sign in / Sign up

Export Citation Format

Share Document