Degradation of the low voltage power MOSFET electrical parameters during multipulse UIS test

Author(s):  
Juraj Marek ◽  
Daniel Donoval ◽  
Miroslav Petrus ◽  
Oubica Stuchlikova ◽  
Ales Chvala ◽  
...  
2009 ◽  
Vol 56 (8) ◽  
pp. 1761-1766 ◽  
Author(s):  
Jacky C. W. Ng ◽  
Johnny K. O. Sin
Keyword(s):  

Author(s):  
Lars Vestling ◽  
Lars Bengtsson ◽  
Jorgen Olsson

2013 ◽  
Vol 1567 ◽  
Author(s):  
Stefano Lai ◽  
Piero Cosseddu ◽  
Gian Carlo Gazzadi ◽  
Giovanni Martines ◽  
Annalisa Bonfiglio ◽  
...  

ABSTRACTA novel structure for Organic Thin-Film Transistor (OTFT) is here presented. The devices are fabricated using a one-mask, photolithographic self-alignment technique which can be performed with standard photoresists and without further chemical treatments. This technique, combined with a novel technology for the realization of low voltage OTFTs, allows a dramatic reduction of the parasitic capacitances thus leading to a remarkable cut-off frequency. In this paper, the main electrical parameters of low voltage, self-aligned devices are reported, and a complete frequency characterization of the devices is given. These characteristics make the reported approach suitable for the development of basic circuitries for frequency applications.


2002 ◽  
Vol 25 (2) ◽  
pp. 147-153 ◽  
Author(s):  
H. Zillgen ◽  
M. Stenzel ◽  
W. Lohwasser

The replacement of the anode material in tantalum capacitors by a new generation of high CV niobium powders offers the possibility to get an economical alternative to tantalum for a wide range of applications. Due to the high CV potential of niobium powder there is also an alternative to low voltage aluminum electrolytic capacitors. We developed a new niobium capacitor which shows stable electrical values. By optimizing the structure of the dielectric and the cathodic layers as well as the process parameters we gained a capacitor which can be used up to105 °C. Electrical characteristics and lifetest behavior of niobium capacitors out of 100 k–150 k CV/g powder will be discussed.


2010 ◽  
Vol 57 (7) ◽  
pp. 1651-1658 ◽  
Author(s):  
Olayiwola Alatise ◽  
Ian Kennedy ◽  
George Petkos ◽  
Keith Heppenstall ◽  
Khalid Khan ◽  
...  

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