Degradation of the low voltage power MOSFET electrical parameters during multipulse UIS test
2009 ◽
Vol 56
(8)
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pp. 1761-1766
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Keyword(s):
2002 ◽
Vol 25
(2)
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pp. 147-153
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2018 ◽
Vol 10
(4)
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pp. 04017-1-04017-5
Keyword(s):
2010 ◽
Vol 57
(7)
◽
pp. 1651-1658
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