The Ninth International Conference on Advanced Semiconductor Devices and Mircosystems
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9781467311984, 9781467311977, 9781467311960
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Current instabilities and other reliability aspects in AlGaN/GaN MOS-HFETs with atomic layer deposited Al2O3 as gate oxide

2012 ◽  
Author(s):  
R. Stoklas ◽  
D. Gregusova ◽  
J. Novak ◽  
P. Kordos ◽  
M. Tajima ◽  
...  
Keyword(s):  
Atomic Layer ◽  
Gate Oxide

Metal/SI GaAs/Metal systems: Demonstration of unpinning of the Fermi level at the interface

2012 ◽  
Author(s):  
F. Dubecky ◽  
P. Hubik ◽  
E. Gombia ◽  
D. Kindl ◽  
M. Dubecky ◽  
...  
Keyword(s):  
Fermi Level

Degradation of the low voltage power MOSFET electrical parameters during multipulse UIS test

2012 ◽  
Author(s):  
Juraj Marek ◽  
Daniel Donoval ◽  
Miroslav Petrus ◽  
Oubica Stuchlikova ◽  
Ales Chvala ◽  
...  
Keyword(s):  
Low Voltage ◽  
Electrical Parameters ◽  
Power Mosfet

Conductive metal oxide based gates for self-aligned technology of AlGaN/GaN HEMTs

2012 ◽  
Author(s):  
G. Vanko ◽  
M. Vallo ◽  
I. Ryger ◽  
J. Dzuba ◽  
T. Lalinsky
Keyword(s):  
Metal Oxide ◽  
Gan Hemts

Photocurrents in double-layer organic field-effect transistors

2012 ◽  
Author(s):  
J. Jakabovic ◽  
M. Weis ◽  
J. Kovac ◽  
D. Donoval ◽  
M. Donoval ◽  
...  
Keyword(s):  
Double Layer ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Organic Field Effect Transistors

Estimation of exposure parameters of chosen e-beam resists using variable shaped e-beam pattern generator

2012 ◽  
Author(s):  
Robert Andok ◽  
Ladislav Matay ◽  
Ivan Kostic ◽  
Anna Bencurova ◽  
Pavol Nemec ◽  
...  
Keyword(s):  
Pattern Generator ◽  
Beam Pattern
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