Pushing away the silicon limits of ESD protection structures: Exploration of crystallographic orientation
D. Tremouilles
◽
Yuan Gao
◽
M. Bafleur
2010 ◽
Vol 50
(9-11)
◽
pp. 1373-1378
A. Tazzoli
◽
M. Cordoni
◽
P. Colombo
◽
C. Bergonzoni
◽
G. Meneghesso
X. Wang
◽
Z. Shi
◽
J. Liu
◽
L. Wang
◽
R. Ma
◽
...
S. Reggiani
◽
E. Gnani
◽
M. Rudan
◽
G. Baccarani
◽
S. Bychikhin
◽
...
L. Lin
◽
X. Wang
◽
J. Liu
◽
A. Wang
◽
H. Liu
◽
...
J.J. Liou
◽
Xiaofang Gao
◽
J. Bernier
◽
G. Croft
◽
Waisum Wong
◽
...
2020 ◽
Vol 8
◽
pp. 87164-87172
◽
Chenkun Wang
◽
Feilong Zhang
◽
Fei Lu
◽
Qi Chen
◽
Cheng Li
◽
...
2013 ◽
Vol 34
(1)
◽
pp. 111-113
◽
Li Wang
◽
Xin Wang
◽
Zitao Shi
◽
Rui Ma
◽
Jian Liu
◽
...
Caillard
◽
Azais
◽
Nouet
◽
Dournelle
◽
Salome
R. Fried
◽
Y. Blecher
◽
S. Friedman