Refractive index modifications in Chalcogenide films induced by sub-bandgap near-IR femtosecond pulses

2007 ◽  
Author(s):  
T. Anderson ◽  
N. Carlie ◽  
L. Petit ◽  
J. Hu ◽  
A. Agarwal ◽  
...  
Keyword(s):  
Refractive Index ◽  
Femtosecond Pulses ◽  
Chalcogenide Films ◽  
Near Ir

scholarly journals Near IR Refractive Index for GaInN Heavily Doped with Silicon

2009 ◽  
Vol 116 (5) ◽  
pp. 936-938
Author(s):  
G. Cywiński ◽  
R. Kudrawiec ◽  
W. Rzodkiewicz ◽  
M. Kryśko ◽  
E. Litwin-Staszewska ◽  
...  
Keyword(s):  
Refractive Index ◽  
Near Ir ◽  
Heavily Doped

Optical Properties of NiO Thin Films: A Potential Material for Optoelectronic Devices

2012 ◽  
Vol 488-489 ◽  
pp. 103-108 ◽  
Author(s):  
Manisha Tyagi ◽  
Monika Tomar ◽  
Vinay Gupta
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Optical Properties ◽  
Substrate Temperature ◽  
Band Gap ◽  
Urbach Energy ◽  
Rf Sputtering ◽  
Blue Shift ◽  
Structural Disorder ◽  
Near Ir

The influence of substrate temperature on the UV-Visible-near-IR optical properties, namely the band gap, the Urbach energy and the refractive index of NiO thin films deposited by RF sputtering has been investigated. The optical band gap of thin films showed the blue-shift in the transmission spectra with increase in the substrate temperature which is related to variation in carrier concentration of the deposited films. Urbach energy (EU) values indicate that the films deposited at 400 oC substrate temperature show least structural disorder. The refractive index of the films is found to decrease continuously with increase in the substrate temperature at all photon energies in the visible and near-IR region, and is attributed to the decreasing packing density of the films. Introduction

Practical high refractive index resin usable for near-IR and visible wavelengths

2019 ◽  
Author(s):  
Satoru Tomaru ◽  
Yutaka Murakoshi ◽  
Masayuki Michiguchi ◽  
Akihiro Kohno ◽  
Kazumi Yamauchi ◽  
...  
Keyword(s):  
Refractive Index ◽  
High Refractive Index ◽  
Near Ir ◽  
Visible Wavelengths

Micro-Molded High Q Polymer Resonators for Optical Loss Determination

2005 ◽  
Vol 872 ◽  
Author(s):  
Andrea L. Martin ◽  
Akil Srinivasan ◽  
Deniz K. Armani ◽  
Bumki Min ◽  
Kerry J. Vahala
Keyword(s):  
Refractive Index ◽  
Quality Factor ◽  
Effective Refractive Index ◽  
Optical Loss ◽  
Optical Absorption Coefficient ◽  
Quality Factors ◽  
Replica Molding ◽  
High Q ◽  
Whispering Gallery ◽  
Near Ir

AbstractReplica molding of ultra-high-Q toroidal microresonators can produce polymer microresonators with material-limited quality factors (Q). This was demonstrated previously using polymers which cure thermally. In this work, high Q polymer microresonators were fabricated using the replica molding technique from previously uncharacterized polymers which require either a thermal or UV cure. The quality factor and effective refractive index of whispering gallery modes was measured at wavelengths ranging from the visible (680nm) through the near-IR (1550nm). The optical absorption coefficient (material absorption) of these previously uncharacterized polymers was determined from the quality factor and effective refractive index of the polymer.

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