A microscopic insight on light-induced polaron conduction in Fe:LiNbO3

2017 ◽  
Author(s):  
Laura Vittadello ◽  
Marco Bazzan ◽  
Simon Messerschmidt ◽  
Mirco Imlau ◽  
Imed Mhaouech ◽  
...  
Keyword(s):  
Polaron Conduction

Polaron conduction loss in microwave dielectric ceramics

1999 ◽  
Vol 14 (2) ◽  
pp. 500-502
Author(s):  
Seungbum Hong ◽  
Eunah Kim ◽  
Han Wook Song ◽  
Jongwan Choi ◽  
Dae-Weon Kim ◽  
...  
Keyword(s):  
Quality Factor ◽  
Phonon Scattering ◽  
Dielectric Resonators ◽  
Frequency Range ◽  
Conduction Loss ◽  
Microwave Dielectric ◽  
Scattering Effects ◽  
Unloaded Quality Factor ◽  
Dielectric Ceramics ◽  
Polaron Conduction

It has been generally accepted that the product of the unloaded quality factor and resonant frequency is the universal parameter for comparison of dielectric resonators with different size.1,2 However, it is suggested in this study that this universal parameter should be modified due to the presence of the polarons. From the frequency dependence of the unloaded quality factor, it is possible to extract the factor determined only by the phonon scattering effects, and we denoted this parameter by Qs. It was found that the Qs parameter for ZrxSnzTiyO4 (ZST) and Ba(Zn1/3Ta2/3)O3 (BZT) ceramics showed constancy in the frequency range of 2–12 GHz, which supports the idea of polaron conduction loss contribution to the dielectric loss.

Hopping and narrow-band polaron conduction in NiO and CoO

1966 ◽  
Vol 21 (1) ◽  
pp. 20-22 ◽  
Author(s):  
I.G. Austin ◽  
A.J. Springthorpe ◽  
B.A. Smith
Keyword(s):  
Narrow Band ◽  
Polaron Conduction

scholarly journals Polaron conduction mechanisms in (B2O3)-(TeO2)-(MoO3)-(Er2O3) glasses

2019 ◽  
Vol 1172 ◽  
pp. 012012
Author(s):  
M Amarkumar ◽  
T Sankarappa ◽  
J S Ashwajeet ◽  
T Sujatha
Keyword(s):  
Conduction Mechanisms ◽  
Polaron Conduction

High temperature Seebeck coefficient, small-polaron conduction and work function of LiMn1.5Ni0.5O4 thin films

2020 ◽  
Vol 53 (47) ◽  
pp. 475304
Author(s):  
Sruthy Subash ◽  
Vijay Vaiyapuri ◽  
M Navaneethan ◽  
Yuvaraj Sivalingam ◽  
K Kamala Bharathi
Keyword(s):  
Thin Films ◽  
High Temperature ◽  
Seebeck Coefficient ◽  
Work Function ◽  
Small Polaron ◽  
Polaron Conduction ◽  
Small Polaron Conduction

EFFECTS OF COPPER DOPING ON DIELECTRIC AND A.C. CONDUCTIVITY IN LAYERED SODIUM TRI-TITANATE CERAMIC

2013 ◽  
Vol 27 (22) ◽  
pp. 1350114 ◽  
Author(s):  
SHRIPAL ◽  
SHAILJA DWIVEDI ◽  
RAKESH SINGH ◽  
R. P. TANDON
Keyword(s):  
Ionic Conduction ◽  
Relaxation Times ◽  
Paramagnetic Resonance ◽  
Temperature Range ◽  
Higher Temperature ◽  
Polaron Conduction ◽  
Tan Δ ◽  
Lower Temperature ◽  
Electron Paramagnetic ◽  
Derivatives Of

Electron paramagnetic resonance (EPR) spectra of 0.01, 0.1 and 1.0 molar percentage (mp) of CuO doped derivatives of layered Na 2 Ti 3 O 7 ceramic have been reported. The results show that copper substitutes as Cu 2+ at Ti 4+ octahedral sites. From the dependence of loss tangent ( tan δ) and the relative permittivity (ε′) on temperature and frequency, it is concluded that all the derivatives are of polar nature. The relaxation peaks at lower temperatures have been attributed to the presence of different types of dipoles, whereas peaks in the higher temperature region indicate possible ferroelectric phase transition. The dependence of conductivity on temperature show that electron hopping (polaron) conduction exists in a wide span of temperature range. However, the associated interlayer ionic conduction exists in a small temperature range. Interlayer alkali ion hopping mechanism of conduction has been proposed toward higher temperatures. The conductivity versus frequency plots reveal that the polaron conduction plays a prominent role toward the lower temperature side that diminishes with the rise in temperature. The most probable relaxation times for 0.01 and 0.1 mp CuO doped derivatives are almost same but it records an increased value for 1.0 mp doped material. This again attributes to the possible change in the symmetry of copper environment.

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