Comparative study of the electrical and structural characterization of the sub-threshold damage in n- and p-type Si implanted with MeV ions
2011 ◽
Vol 11
(4)
◽
pp. 3306-3313
◽
Keyword(s):
2021 ◽
Photoluminescence study and structural characterization of p-type ZnO doped by N and/or As acceptors
2006 ◽
Vol 22
(2)
◽
pp. 10-14
◽
2013 ◽
Vol 19
(5)
◽
pp. 513-520
◽
2016 ◽
Vol 683
◽
pp. 100-107
◽
2011 ◽
Vol 346
(9)
◽
pp. 1105-1111
◽
2017 ◽
Vol 49
(12)
◽
pp. 1225-1231
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