Pattern selection for testing of deep sub-micron timing defects

Author(s):  
Mango ◽  
C.-T. Chao ◽  
L.-C. Wang ◽  
Kwang-Ting Cheng
Author(s):  
Jiayi Wang ◽  
Iordanis Chatzinikolaidis ◽  
Carlos Mastalli ◽  
Wouter Wolfslag ◽  
Guiyang Xin ◽  
...  

Author(s):  
Yoshinobu Higami ◽  
Hiroshi Furutani ◽  
Takao Sakai ◽  
Shuichi Kameyama ◽  
Hiroshi Takahashi

2017 ◽  
Author(s):  
Stephen Thompson ◽  
Yannic Meuer ◽  
Eddie Edwards ◽  
João Ramalhinho ◽  
Maria Ruxandra Robu ◽  
...  

2007 ◽  
Vol 19 (3) ◽  
pp. 816-855 ◽  
Author(s):  
Hyunjung Shin ◽  
Sungzoon Cho

The support vector machine (SVM) has been spotlighted in the machine learning community because of its theoretical soundness and practical performance. When applied to a large data set, however, it requires a large memory and a long time for training. To cope with the practical difficulty, we propose a pattern selection algorithm based on neighborhood properties. The idea is to select only the patterns that are likely to be located near the decision boundary. Those patterns are expected to be more informative than the randomly selected patterns. The experimental results provide promising evidence that it is possible to successfully employ the proposed algorithm ahead of SVM training.


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