test pattern selection Latest Research Papers

On Achieving Maximal Chain Diagnosis Resolution through Test Pattern Selection

2016 IEEE 25th Asian Test Symposium (ATS) ◽

10.1109/ats.2016.22 ◽

2016 ◽

Cited By ~ 2

Author(s):

Xijiang Lin ◽

Sudhakar M. Reddy ◽

Wu-Tung Cheng

Keyword(s):

Test Pattern ◽

Maximal Chain ◽

Pattern Selection ◽

Test Pattern Selection

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A test pattern selection method for dynamic burn-in of logic circuits based on ATPG technique

2013 IEEE 10th International Conference on ASIC ◽

10.1109/asicon.2013.6811958 ◽

2013 ◽

Cited By ~ 1

Author(s):

Xuan Yang ◽

Xiaole Cui ◽

Chao Wang ◽

Chung-Len Lee

Keyword(s):

Test Pattern ◽

Selection Method ◽

Logic Circuits ◽

Pattern Selection ◽

Test Pattern Selection

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Compact Test Pattern Selection for Small Delay Defect

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2013.2237946 ◽

2013 ◽

Vol 32 (6) ◽

pp. 971-975 ◽

Cited By ~ 6

Author(s):

Chia-Yuan Chang ◽

Kuan-Yu Liao ◽

Sheng-Chang Hsu ◽

J. C. Li ◽

Jiann-Chyi Rau

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Small Delay ◽

Selection For ◽

Compact Test ◽

Test Pattern Selection

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The new test pattern selection method for OPC model calibration, based on the process of clustering in a hybrid space

10.1117/12.953827 ◽

2012 ◽

Cited By ~ 10

Author(s):

Dmitry Vengertsev ◽

Kihyun Kim ◽

Seung-Hune Yang ◽

Seongbo Shim ◽

Seongho Moon ◽

...

Keyword(s):

Model Calibration ◽

Test Pattern ◽

Selection Method ◽

Pattern Selection ◽

Hybrid Space ◽

Test Pattern Selection

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Test Pattern Selection for Defect-Aware Test

2011 Asian Test Symposium ◽

10.1109/ats.2011.24 ◽

2011 ◽

Cited By ~ 2

Author(s):

Yoshinobu Higami ◽

Hiroshi Furutani ◽

Takao Sakai ◽

Shuichi Kameyama ◽

Hiroshi Takahashi

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Selection For ◽

Test Pattern Selection

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On High-Quality Test Pattern Selection and Manipulation

2011 Sixteenth IEEE European Test Symposium ◽

10.1109/ets.2011.49 ◽

2011 ◽

Author(s):

Feng Yuan ◽

Xiao Liu ◽

Qiang Xu

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Quality Test ◽

High Quality ◽

Test Pattern Selection

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Test Pattern Selection and Compaction for Sequential Circuits in an HDL Environment

2010 19th IEEE Asian Test Symposium ◽

10.1109/ats.2010.85 ◽

2010 ◽

Cited By ~ 7

Author(s):

M. H. Haghbayan ◽

S. Karamati ◽

F. Javaheri ◽

Z. Navabi

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Selection ◽

Test Pattern Selection

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A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes [Transactions Letters

IEEE Transactions on Communications ◽

10.1109/tcomm.2010.06.0801652 ◽

2010 ◽

Vol 58 (6) ◽

pp. 1601-1604

Author(s):

Hitoshi Tokushige ◽

Marc C. Foss ◽

Tadao Kasami

Keyword(s):

Test Pattern ◽

Selection Method ◽

Binary Codes ◽

Pattern Selection ◽

Decoding Algorithm ◽

Bounded Distance ◽

Test Pattern Selection

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Test pattern selection to optimize delay test quality with a limited size of test set

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512733 ◽

2010 ◽

Cited By ~ 1

Author(s):

Michiko Inoue ◽

Akira Taketani ◽

Tomokazu Yoneda ◽

Hiroshi Iwata ◽

Hideo Fujiwara

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Delay Test ◽

Test Quality ◽

Test Set ◽

Limited Size ◽

Test Pattern Selection

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Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2010.2043591 ◽

2010 ◽

Vol 29 (5) ◽

pp. 760-773 ◽

Cited By ~ 41

Author(s):

Mahmut Yilmaz ◽

Krishnendu Chakrabarty ◽

Mohammad Tehranipoor

Keyword(s):

Integrated Circuits ◽

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Deep Submicrometer ◽

Selection For ◽

Delay Defects ◽

Test Pattern Selection

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test pattern selection
Recently Published Documents

TOTAL DOCUMENTS

H-INDEX

On Achieving Maximal Chain Diagnosis Resolution through Test Pattern Selection

A test pattern selection method for dynamic burn-in of logic circuits based on ATPG technique

Compact Test Pattern Selection for Small Delay Defect

The new test pattern selection method for OPC model calibration, based on the process of clustering in a hybrid space

Test Pattern Selection for Defect-Aware Test

On High-Quality Test Pattern Selection and Manipulation

Test Pattern Selection and Compaction for Sequential Circuits in an HDL Environment

A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes [Transactions Letters

Test pattern selection to optimize delay test quality with a limited size of test set

Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits

Export Citation Format

test pattern selectionRecently Published Documents

TOTAL DOCUMENTS

H-INDEX

On Achieving Maximal Chain Diagnosis Resolution through Test Pattern Selection

A test pattern selection method for dynamic burn-in of logic circuits based on ATPG technique

Compact Test Pattern Selection for Small Delay Defect

The new test pattern selection method for OPC model calibration, based on the process of clustering in a hybrid space

Test Pattern Selection for Defect-Aware Test

On High-Quality Test Pattern Selection and Manipulation

Test Pattern Selection and Compaction for Sequential Circuits in an HDL Environment

A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes [Transactions Letters

Test pattern selection to optimize delay test quality with a limited size of test set

Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits

test pattern selection
Recently Published Documents