Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects

Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2010.2043591 ◽

2010 ◽

Vol 29 (5) ◽

pp. 760-773 ◽

Cited By ~ 41

Author(s):

Mahmut Yilmaz ◽

Krishnendu Chakrabarty ◽

Mohammad Tehranipoor

Keyword(s):

Integrated Circuits ◽

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Deep Submicrometer ◽

Selection For ◽

Delay Defects ◽

Test-Pattern Grading and Pattern Selection for Small-Delay Defects

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.32 ◽

2008 ◽

Cited By ~ 51

Author(s):

Mahmut Yilmaz ◽

Krishnendu Chakrabarty ◽

Mohammad Tehranipoor

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Pattern Grading ◽

Small Delay ◽

Selection For ◽

High-quality pattern selection for screening small-delay defects considering process variations and crosstalk

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) ◽

10.1109/date.2010.5457036 ◽

2010 ◽

Cited By ~ 10

Author(s):

Ke Peng ◽

Mahmut Yilmaz ◽

Mohammad Tehranipoor ◽

Krishnendu Chakrabarty

Keyword(s):

Process Variations ◽

Pattern Selection ◽

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Impact of Hazards on Pattern Selection for Small Delay Defects

2009 15th IEEE Pacific Rim International Symposium on Dependable Computing ◽

10.1109/prdc.2009.17 ◽

2009 ◽

Cited By ~ 2

Author(s):

Jie Wang ◽

Huawei Li ◽

Yinghua Min ◽

Xiaowei Li ◽

Huaguo Liang

Keyword(s):

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Compact Test Pattern Selection for Small Delay Defect

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2013.2237946 ◽

2013 ◽

Vol 32 (6) ◽

pp. 971-975 ◽

Cited By ~ 6

Author(s):

Chia-Yuan Chang ◽

Kuan-Yu Liao ◽

Sheng-Chang Hsu ◽

J. C. Li ◽

Jiann-Chyi Rau

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Small Delay ◽

Selection For ◽

Compact Test ◽

Test Pattern Selection for Defect-Aware Test

2011 Asian Test Symposium ◽

10.1109/ats.2011.24 ◽

2011 ◽

Cited By ~ 2

Author(s):

Yoshinobu Higami ◽

Hiroshi Furutani ◽

Takao Sakai ◽

Shuichi Kameyama ◽

Hiroshi Takahashi

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Selection For ◽

Graph partition based path selection for testing of small delay defects

2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) ◽

10.1109/aspdac.2010.5419831 ◽

2010 ◽

Cited By ~ 1

Author(s):

Zijian He ◽

Tao Lv ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Path Selection ◽

Graph Partition ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Circuit Topology-Based Test Pattern Generation for Small-Delay Defects

2010 19th IEEE Asian Test Symposium ◽

10.1109/ats.2010.59 ◽

2010 ◽

Cited By ~ 17

Author(s):

Sandeep Kumar Goel ◽

Krishnendu Chakrabarty ◽

Mahmut Yilmaz ◽

Ke Peng ◽

Mohammad Tehranipoor

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Circuit Topology ◽

Small Delay Defects ◽

Small Delay ◽

Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ◽

10.1201/b15549-10 ◽

2017 ◽

pp. 147-160

Author(s):

K. Goel Sandeep ◽

Devta-Prasanna Narendra

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Small Delay Defects ◽

Small Delay ◽

Circuit Topology-Based Test Pattern Generation for Small-Delay Defects

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ◽

10.1201/b15549-11 ◽

2017 ◽

pp. 161-182

Author(s):

K. Goel Sandeep ◽

Chakrabarty Krish

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Circuit Topology ◽

Small Delay Defects ◽

Small Delay ◽