Multi-bias nonlinear characterization of GaN FET trapping effects through a multiple pulse time domain network analyzer

Author(s):  
Alberto Santarelli ◽  
Rafael Cignani ◽  
Daniel Niessen ◽  
Gian Piero Gibiino ◽  
Pier Andrea Traverso ◽  
...  
2018 ◽  
Vol 83 (3) ◽  
pp. 30601 ◽  
Author(s):  
Abelin Kameni ◽  
Florent Loete ◽  
Lionel Pichon

This paper presents experimental and numerical studies of a chafing soft defect realized by partially milling coaxial cables. The approach is based on the time domain reflectometry technique. The numerical model consists in solving Maxwell’s equations while an incident Gaussian pulse is injected on the faulty line. The experimental time domain measurements are performed with a vector network analyzer. To get the experimental results comparable to the numerical ones, a process to denoise the measured impulse responses is proposed. The reflection coefficients obtained are compared to those given by a classical approach based on a chain matrix model to show the impact of 3D numerical modeling in studying soft faults.


2021 ◽  
Vol 130 (5) ◽  
pp. 053104
Author(s):  
Sathyan Sandeep ◽  
Théo Thréard ◽  
Elton De Lima Savi ◽  
Nikolay Chigarev ◽  
Alain Bulou ◽  
...  

Optik ◽  
2020 ◽  
Vol 224 ◽  
pp. 165711
Author(s):  
Noureddine Maamar ◽  
Mohamed Lazoul ◽  
Feriel Yasmine Latreche ◽  
Djalal Trache ◽  
Jean-Louis Coutaz

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