Improved Dielectric Properties of Polypropylene Films Based on Aromatic Compounds

Author(s):  
Boxue Du ◽  
Jiwen Xing ◽  
Meng Xiao ◽  
Zhaoyu Ran ◽  
Haoliang Liu ◽  
...  
Polymers ◽  
2019 ◽  
Vol 11 (6) ◽  
pp. 1033 ◽  
Author(s):  
Wei Dong ◽  
Xuan Wang ◽  
Zaixing Jiang ◽  
Bo Tian ◽  
Yuguang Liu ◽  
...  

Acetophenone can significantly improve the dielectric properties of polyethylene (PE) insulation materials. However, it easily migrates from the PE due to its poor compatibility with the material, which limits its application. In this paper, the functional units of acetophenone were modified in polystyrene-b-poly(ethylene-co-butylene)-b-polystyrene (SEBS) by an acetylation reaction, and SEBS was used as the carrier to inhibit the migration of acetophenone. The number of functional units in the acetylated SEBS (Ac-SEBS) was measured by 1H NMR and the effect of the acetylation degree of SEBS on its compatibility with PE was studied. Meanwhile, the effects of Ac-SEBS on PE’s direct current (DC) breakdown strength and space charge accumulation characteristics were investigated. It is demonstrated that Ac-SEBS can significantly improve the field strength of the DC breakdown and inhibit the accumulation of space charge in the PE matrix. This work provides a new approach for the application of aromatic compounds as voltage stabilizers in DC insulation cable materials.


1991 ◽  
Vol 111 (3) ◽  
pp. 10-17 ◽  
Author(s):  
Tetsuroh Tokoro ◽  
Kazuyuki Tohyama ◽  
Mamoru Takusagawa ◽  
Masayuki Nagao ◽  
Masamitsu Kosaki

1990 ◽  
Vol 110 (6) ◽  
pp. 372-378 ◽  
Author(s):  
Tetsuroh Tokoro ◽  
Kazuyuki Tohyama ◽  
Mamoru Takusagawa ◽  
Masayuki Nagao ◽  
Masamitsu Kosaki

2014 ◽  
Vol 9 (4) ◽  
pp. 15-38
Author(s):  
Sergei Kuznetsov ◽  
Mikhail Astafev ◽  
Pavel Lazorskiy ◽  
Vladislav Sklyarov ◽  
Evgeny Lonshakov ◽  
...  

We describe three alternative quasi-optical methods for measuring dielectric properties of low-absorbing polymeric films at subterahertz frequencies using BWO-spectroscopy. For two of them, the dielectric permittivity of a pure film is determined through amplitude-phase measurements when the film is inserted into Mach-Zehnder and Fabry-Perot interferometers. In the third case, the permittivity is retrieved via investigating spectral features of a supplementary resonant metallic structure created on the film’s surface to enhance its dispersive properties. The described methods were applied to measure the dielectric permittivity for polypropylene films of different thickness (from 10 to 512 um) from the GoodFellow company (UK). The experimental data obtained by these three techniques are compared with each other and the analysis of factors explaining discrepancy in the measured values of the dielectric permittivity is presented


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