Extraction of the induced gate noise, channel noise, and their correlation in submicron MOSFETs from RF noise measurements

2001 ◽  
Vol 48 (12) ◽  
pp. 2884-2892 ◽  
Author(s):  
Chih-Hung Chen ◽  
M.J. Deen ◽  
Yuhua Cheng ◽  
M. Matloubian
Keyword(s):  
Channel Noise ◽  
Noise Measurements ◽  
Rf Noise

RF noise simulation for submicron MOSFET's based on hydrodynamic model

2003 ◽  
Author(s):  
Jung-Suk Goo ◽  
Chang-Hoon Choi ◽  
E. Morifuji ◽  
H.S. Momose ◽  
Zhiping Yu ◽  
...  
Keyword(s):  
Hydrodynamic Model ◽  
Noise Simulation ◽  
Rf Noise

Numerical modeling of RF noise in scaled MOS devices

2006 ◽  
Vol 50 (1) ◽  
pp. 10-17 ◽  
Author(s):  
C. Jungemann ◽  
B. Neinhüs ◽  
C.D. Nguyen ◽  
A.J. Scholten ◽  
L.F. Tiemeijer ◽  
...  
Keyword(s):  
Numerical Modeling ◽  
Mos Devices ◽  
Rf Noise

scholarly journals RF noise driven dipole mode parametric resonance

2002 ◽  
Author(s):  
Yujong Kim ◽  
C. Kim ◽  
K.H. Kim ◽  
I.H. Yu ◽  
J.S. Yang ◽  
...  
Keyword(s):  
Parametric Resonance ◽  
Dipole Mode ◽  
Rf Noise

Experimental Demonstration and Modeling of Excess RF Noise in Sub-100-nm CMOS Technologies

2010 ◽  
Vol 31 (8) ◽  
pp. 884-886 ◽  
Author(s):  
Geert D J Smit ◽  
Andries J Scholten ◽  
Ralf M T Pijper ◽  
Ronald van Langevelde ◽  
Luuk F Tiemeijer ◽  
...  
Keyword(s):  
Experimental Demonstration ◽  
Rf Noise

A Physical Understanding of RF Noise in Bulk nMOSFETs With Channel Lengths in the Nanometer Regime

2012 ◽  
Vol 59 (1) ◽  
pp. 197-205 ◽  
Author(s):  
Vinayak M. Mahajan ◽  
Pradeep Rao Patalay ◽  
Renuka P. Jindal ◽  
Hisashi Shichijo ◽  
Sam Martin ◽  
...  
Keyword(s):  
Physical Understanding ◽  
Channel Lengths ◽  
Rf Noise ◽  
Nanometer Regime
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