Investigation on Channel Hot Carrier degradation of ultra deep submicron SOI pMOSFETs

2012 ◽  
Author(s):  
Liang-Xi Huang ◽  
Xia An ◽  
Fei Tan ◽  
Wei-Kang Wu ◽  
Ru Huang
Keyword(s):  
Deep Submicron ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Impact of E-E scattering to the hot carrier degradation of deep submicron NMOSFETs

1998 ◽  
Vol 19 (12) ◽  
pp. 463-465 ◽  
Author(s):  
S.E. Rauch ◽  
F.J. Guarin ◽  
G. LaRosa
Keyword(s):  
Deep Submicron ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Hot-carrier degradation for deep-submicron N-MOSFETs introduced by back-end processing

1997 ◽  
Author(s):  
Donald Y. C. Lie ◽  
Wei Xia ◽  
Jiro Yota ◽  
Atul B. Joshi ◽  
R. Zwingman ◽  
...  
Keyword(s):  
Deep Submicron ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Three hot-carrier degradation mechanisms in deep-submicron PMOSFET's

1995 ◽  
Vol 42 (1) ◽  
pp. 109-115 ◽  
Author(s):  
R. Woltjer ◽  
G.M. Paulzen ◽  
H.G. Pomp ◽  
H. Lifka ◽  
P.H. Woerlee
Keyword(s):  
Deep Submicron ◽  
Degradation Mechanisms ◽  
Hot Carrier ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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