A GaN HEMTs half-bridge driver with bandgap reference comparator clamping for high-frequency DC-DC converter

Author(s):  
Renhui Yan ◽  
Shengpeng Tang ◽  
Jianxiong Xi ◽  
Lenian He ◽  
Kexu Sun
2009 ◽  
Vol 193 ◽  
pp. 012040 ◽  
Author(s):  
F A Marino ◽  
N Faralli ◽  
D K Ferry ◽  
S M Goodnick ◽  
M Saraniti

Author(s):  
Xi Luo ◽  
Subrata Halder ◽  
Walter R. Curtice ◽  
James C. M. Hwang ◽  
Kelson D. Chabak ◽  
...  

2000 ◽  
Vol 622 ◽  
Author(s):  
O. Breitschädel ◽  
L. Kley ◽  
H. Gräbeldinger ◽  
B. Kuhn ◽  
F. Scholz ◽  
...  

ABSTRACTWe report on our progress on the fabrication of AlGaN/GaN HEMTs with extremely short gate length. AlGaN/GaN HEMTs with different gate length from 6 νm down to 60nm were fabricated to investigate DC- and high frequency behavior as well as short channel effects. We have found that the transistors with gates in the 100 nm range can be improved in the device performance with respect to transconductance and high frequency but shows also short channel effects as the loss of saturation in the output characteristics and a strong dependency of the threshold voltage on the gate length.


2009 ◽  
Author(s):  
J. Mateos ◽  
S. Pérez ◽  
D. Pardo ◽  
T. González ◽  
Massimo Macucci ◽  
...  

2006 ◽  
Vol 203 (7) ◽  
pp. 1845-1850 ◽  
Author(s):  
T. Palacios ◽  
Y. Dora ◽  
A. Chakraborty ◽  
C. Sanabria ◽  
S. Keller ◽  
...  

2013 ◽  
Vol 50 (3) ◽  
pp. 323-332 ◽  
Author(s):  
T. Kikkawa ◽  
M. Kanamura ◽  
T. Ohki ◽  
K. Imanishi ◽  
K. Watanabe ◽  
...  

2011 ◽  
Vol 3 (3) ◽  
pp. 301-309 ◽  
Author(s):  
Olivier Jardel ◽  
Guillaume Callet ◽  
Jérémy Dufraisse ◽  
Michele Piazza ◽  
Nicolas Sarazin ◽  
...  

A study of the electrical performances of AlInN/GaN High Electron Mobility Transistors (HEMTs) on SiC substrates is presented in this paper. Four different wafers with different technological and epitaxial processes were characterized. Thanks to intensive characterizations as pulsed-IV, [S]-parameters, and load-pull measurements from S to Ku bands, it is demonstrated here that AlInN/GaN HEMTs show excellent power performances and constitute a particularly interesting alternative to AlGaN/GaN HEMTs, especially for high-frequency applications beyond the X band. The measured transistors with 250 nm gate lengths from different wafers delivered in continuous wave (cw): 10.8 W/mm with 60% associated power added efficiency (PAE) at 3,5 GHz, 6.6 W/mm with 39% associated PAE at 10.24 GHz, and 4.2 W/mm with 43% associated PAE at 18 GHz.


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