New method for temperature-dependent thermal resistance and capacitance accurate extraction in high-voltage DMOS transistors

2004 ◽  
Author(s):  
C. Anghel ◽  
N. Hefyene ◽  
R. Gillon ◽  
M. Tack ◽  
M.J. Declercq ◽  
...  
Keyword(s):  
Thermal Resistance ◽  
High Voltage ◽  
New Method ◽  
Temperature Dependent

A Drain–Source Connection Technique: Thermal Resistance Measurement Method for GaN HEMTs Using TSEP at High Voltage

2020 ◽  
Vol 67 (12) ◽  
pp. 5454-5459
Author(s):  
Xuan Li ◽  
Shiwei Feng ◽  
Chang Liu ◽  
Yamin Zhang ◽  
Kun Bai ◽  
...  
Keyword(s):  
Thermal Resistance ◽  
High Voltage ◽  
Measurement Method ◽  
Resistance Measurement ◽  
Gan Hemts

A New Method of Fault Phase Identification for High Voltage Transmission Lines Based on the Fault Component of Phase Voltage

2013 ◽  
Vol 732-733 ◽  
pp. 1056-1064
Author(s):  
Yang Chen ◽  
Yan Hu ◽  
Neng Ling Tai
Keyword(s):  
Kalman Filter ◽  
High Voltage ◽  
Transmission Lines ◽  
High Sensitivity ◽  
New Method ◽  
Phase Identification ◽  
Phase Voltage ◽  
Two Phase ◽  
Kalman Filter Algorithm ◽  
High Voltage Transmission

Since the existing fault phase identification methods can not identify all fault types quickly and accurately for high voltage transmission lines, this article proposed a new method of fault phase identification based on the fault component of phase voltage difference and the kalman filter algorithm. The method defined the fault components ratio of one phase voltage to the difference of the other two phase voltages as a fault phase identification factor. By analyzing the characteristics of fault phase identification factors in each fault type, the fault phase can be identified. Simulation results show that using the kalman filter algorithm to extract fundamental component is faster and more accurate. Meanwhile, the method can identify fault phases within half a cycle and is scarcely influenced by fault resistances, fault locations and fault initial phase angles. It also has a high sensitivity when the fault is on the side of strong source.

A scalable model for temperature dependent thermal resistance of SiGe HBTs

2013 ◽  
Author(s):  
Amit Kumar Sahoo ◽  
Sebastien Fregonese ◽  
Mario Weiss ◽  
Cristell Maneux ◽  
Thomas Zimmer
Keyword(s):  
Thermal Resistance ◽  
Temperature Dependent

New method for threshold voltage extraction of high-voltage MOSFETs based on gate-to-drain capacitance measurement

2006 ◽  
Vol 27 (7) ◽  
pp. 602-604 ◽  
Author(s):  
C. Anghel ◽  
B. Bakeroot ◽  
Y.S. Chauhan ◽  
R. Gillon ◽  
C. Maier ◽  
...  
Keyword(s):  
High Voltage ◽  
Threshold Voltage ◽  
New Method ◽  
Capacitance Measurement
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