Suppression of crosstalk by using backside deep trench isolation for 1.12μm backside illuminated CMOS image sensor

Author(s):  
Y. Kitamura ◽  
H. Aikawa ◽  
K. Kakehi ◽  
T. Yousyou ◽  
K. Eda ◽  
...  
Nano Letters ◽  
2017 ◽  
Vol 17 (5) ◽  
pp. 3159-3164 ◽  
Author(s):  
Yu Horie ◽  
Seunghoon Han ◽  
Jeong-Yub Lee ◽  
Jaekwan Kim ◽  
Yongsung Kim ◽  
...  

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