The Impact of the Shallow-Trench Isolation Effect on Flicker Noise of Source Follower MOSFETs in a CMOS Image Sensor

2018 ◽  
Vol 18 (6) ◽  
pp. 4217-4221
Author(s):  
C. C Fan ◽  
Y. C Chiu ◽  
C Liu ◽  
W. W Lai ◽  
C. H Cheng ◽  
...  
Keyword(s):  
Flicker Noise ◽  
Cmos Image Sensor ◽  
Image Sensor ◽  
Isolation Effect ◽  
Shallow Trench Isolation ◽  
Trench Isolation ◽  
Source Follower ◽  
The Impact

scholarly journals A CMOS Image Sensor With In-Pixel Buried-Channel Source Follower and Optimized Row Selector

2009 ◽  
Vol 56 (11) ◽  
pp. 2390-2397 ◽  
Author(s):  
Yue Chen ◽  
Xinyang Wang ◽  
Adri J. Mierop ◽  
Albert J. P. Theuwissen
Keyword(s):  
Cmos Image Sensor ◽  
Image Sensor ◽  
Buried Channel ◽  
Source Follower

The Impact of Shallow Trench Isolation on the Channel Hot Electron Programming Behaviors of SONOS Cells

2019 ◽  
Vol 18 (1) ◽  
pp. 43-48 ◽  
Author(s):  
Zhiguo Li ◽  
Fan Yang ◽  
Joshua Wang ◽  
Peter Lin ◽  
Jianguang Chang ◽  
...  
Keyword(s):  
Hot Electron ◽  
Shallow Trench Isolation ◽  
Trench Isolation ◽  
The Impact

scholarly journals [Papers] Statistical Analyses of Random Telegraph Noise in Pixel Source Follower with Various Gate Shapes in CMOS Image Sensor

2018 ◽  
Vol 6 (3) ◽  
pp. 163-170
Author(s):  
Shinya Ichino ◽  
Takezo Mawaki ◽  
Akinobu Teramoto ◽  
Rihito Kuroda ◽  
Shunichi Wakashima ◽  
...  
Keyword(s):  
Cmos Image Sensor ◽  
Image Sensor ◽  
Statistical Analyses ◽  
Random Telegraph Noise ◽  
Telegraph Noise ◽  
Source Follower
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