Analysis on the efficiency of pattern recognition layers using information measures

Author(s):  
Youngjik Lee ◽  
Hyun Kyung Song
Author(s):  
Jia Syuen Chai ◽  
Ganeshsree Selvachandran ◽  
Florentin Smarandache ◽  
Vassilis C. Gerogiannis ◽  
Le Hoang Son ◽  
...  

AbstractThe single-valued neutrosophic set (SVNS) is a well-known model for handling uncertain and indeterminate information. Information measures such as distance measures, similarity measures and entropy measures are very useful tools to be used in many applications such as multi-criteria decision making (MCDM), medical diagnosis, pattern recognition and clustering problems. A lot of such information measures have been proposed for the SVNS model. However, many of these measures have inherent problems that prevent them from producing reasonable or consistent results to the decision makers. In this paper, we propose several new distance and similarity measures for the SVNS model. The proposed measures have been verified and proven to comply with the axiomatic definition of the distance and similarity measure for the SVNS model. A detailed and comprehensive comparative analysis between the proposed similarity measures and other well-known existing similarity measures has been done. Based on the comparison results, it is clearly proven that the proposed similarity measures are able to overcome the shortcomings that are inherent in existing similarity measures. Finally, an extensive set of numerical examples, related to pattern recognition and medical diagnosis, is given to demonstrate the practical applicability of the proposed similarity measures. In all numerical examples, it is proven that the proposed similarity measures are able to produce accurate and reasonable results. To further verify the superiority of the suggested similarity measures, the Spearman’s rank correlation coefficient test is performed on the ranking results that were obtained from the numerical examples, and it was again proven that the proposed similarity measures produced the most consistent ranking results compared to other existing similarity measures.


Author(s):  
G.Y. Fan ◽  
J.M. Cowley

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.


Author(s):  
L. Fei ◽  
P. Fraundorf

Interface structure is of major interest in microscopy. With high resolution transmission electron microscopes (TEMs) and scanning probe microscopes, it is possible to reveal structure of interfaces in unit cells, in some cases with atomic resolution. A. Ourmazd et al. proposed quantifying such observations by using vector pattern recognition to map chemical composition changes across the interface in TEM images with unit cell resolution. The sensitivity of the mapping process, however, is limited by the repeatability of unit cell images of perfect crystal, and hence by the amount of delocalized noise, e.g. due to ion milling or beam radiation damage. Bayesian removal of noise, based on statistical inference, can be used to reduce the amount of non-periodic noise in images after acquisition. The basic principle of Bayesian phase-model background subtraction, according to our previous study, is that the optimum (rms error minimizing strategy) Fourier phases of the noise can be obtained provided the amplitudes of the noise is given, while the noise amplitude can often be estimated from the image itself.


1989 ◽  
Vol 34 (11) ◽  
pp. 988-989
Author(s):  
Erwin M. Segal
Keyword(s):  

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