Understanding of Trap-Assisted Tunneling Current - Assisted by Oxygen Vacancies in RuOx/SrTiO3/TiN MIM Capacitor for the DRAM Application
2012 ◽
Vol 11
(5)
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pp. 871-876
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Keyword(s):
2020 ◽
Vol 67
(5)
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pp. 2106-2112
Keyword(s):
2009 ◽
Vol 30
(5)
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pp. 562-564
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Keyword(s):
2001 ◽
Vol 40
(Part 1, No. 4B)
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pp. 2840-2843
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