Two-State Trap-Assisted Tunneling Current Characteristics in $\hbox{Al}_{\bf 2}\hbox{O}_{\bf 3}/\hbox{SiO}_{\bf 2}/\hbox{SiC}$ Structures With Ultrathin Dielectrics

2012 ◽  
Vol 11 (5) ◽  
pp. 871-876 ◽  
Author(s):  
Jung-Chin Chiang ◽  
Jenn-Gwo Hwu
2002 ◽  
Vol 81 (25) ◽  
pp. 4757-4759 ◽  
Author(s):  
Q. K. Yang ◽  
F. Fuchs ◽  
J. Schmitz ◽  
W. Pletschen

2007 ◽  
Vol 102 (5) ◽  
pp. 054501 ◽  
Author(s):  
W. K. Loke ◽  
S. F. Yoon ◽  
S. Wicaksono ◽  
K. H. Tan ◽  
K. L. Lew

2009 ◽  
Vol 30 (5) ◽  
pp. 562-564 ◽  
Author(s):  
E. Simoen ◽  
F. De Stefano ◽  
G. Eneman ◽  
B. De Jaeger ◽  
C. Claeys ◽  
...  

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