17x Reliability Enhanced LDPC Code with Burst-Error Masking and High-Precision LLR for Highly Reliable Solid-State-Drives with TLC NAND Flash Memory

Author(s):  
Tsukasa Tokutomi ◽  
Ken Takeuchi
2017 ◽  
Vol 105 (9) ◽  
pp. 1725-1750 ◽  
Author(s):  
Neal R. Mielke ◽  
Robert E. Frickey ◽  
Ivan Kalastirsky ◽  
Minyan Quan ◽  
Dmitry Ustinov ◽  
...  

2012 ◽  
Vol 9 (8) ◽  
pp. 779-794 ◽  
Author(s):  
Ken Takeuchi ◽  
Teruyoshi Hatanaka ◽  
Shuhei Tanakamaru

2013 ◽  
Vol 62 (5) ◽  
pp. 1051-1057 ◽  
Author(s):  
Yangyang Pan ◽  
Guiqiang Dong ◽  
Ningde Xie ◽  
Tong Zhang

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