Investigation of single event upset and total ionizing dose in FeRAM for medical electronic tag

2015 ◽  
Author(s):  
Taiki Uemura ◽  
Masanori Hashimoto
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Total Ionizing Dose ◽  
Medical Electronic ◽  
Electronic Tag

Total Ionizing Dose Influence on the Single-Event Upset Sensitivity of 130-nm PD SOI SRAMs

2017 ◽  
Vol 64 (7) ◽  
pp. 1897-1904 ◽  
Author(s):  
Qiwen Zheng ◽  
Jiangwei Cui ◽  
Mengxin Liu ◽  
Hang Zhou ◽  
Mohan Liu ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Total Ionizing Dose

The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose

2018 ◽  
Vol 65 (8) ◽  
pp. 1920-1927 ◽  
Author(s):  
Qiwen Zheng ◽  
Jiangwei Cui ◽  
Wu Lu ◽  
Hongxia Guo ◽  
Jie Liu ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Total Ionizing Dose

SEU (Single Event Upset) Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors,

1986 ◽  
Author(s):  
R. Koga ◽  
W. A. Kolasinski ◽  
C. King ◽  
J. Cusick
Keyword(s):  
Single Event Upset ◽  
Single Event

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor

2021 ◽  
Author(s):  
Shuting Shi ◽  
Rui Chen ◽  
Rui Liu ◽  
Mo Chen ◽  
Chen Shen ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Arm Processor ◽  
28 Nm
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