Real-Time State Analysis of Digitron and Press Plate in Transformer Substations

2016 ◽  
Author(s):  
Hongmin Zhu ◽  
Daoqing Dai ◽  
Jingzheng Li
Keyword(s):  
Real Time ◽  
Press Plate ◽  
State Analysis

Non-Steady State Analysis of Enzyme Kinetics in Real Time Elucidates Substrate Association and Dissociation Rates: Demonstration with Analysis of Firefly Luciferase Mutants

Biochemistry ◽  
2019 ◽  
Vol 58 (23) ◽  
pp. 2695-2702
Author(s):  
Renee Dale ◽  
Yuki Ohmuro-Matsuyama ◽  
Hiroshi Ueda ◽  
Naohiro Kato
Keyword(s):  
Steady State ◽  
Enzyme Kinetics ◽  
Real Time ◽  
Firefly Luciferase ◽  
Steady State Analysis ◽  
State Analysis

A Practical Method for Automatic Real-Time EEG Sleep State Analysis

1980 ◽  
Vol BME-27 (4) ◽  
pp. 212-220 ◽  
Author(s):  
Arthur J. Lim ◽  
Wallace D. Winters
Keyword(s):  
Real Time ◽  
Practical Method ◽  
Sleep State ◽  
State Analysis

Real-Time Drowsiness Identification based on Eye State Analysis

2021 ◽  
Author(s):  
Nageshwar Nath Pandey ◽  
Naresh Babu Muppalaneni
Keyword(s):  
Real Time ◽  
State Analysis

Safe State Analysis of Real-Time Control Applications

1997 ◽  
Vol 30 (3) ◽  
pp. 149-154
Author(s):  
Peter R. Croll ◽  
Derek G. Marriott
Keyword(s):  
Real Time ◽  
Real Time Control ◽  
Control Applications ◽  
Time Control ◽  
Safe State ◽  
State Analysis

Some Recent Results in Quiescent Prominence Spectrometry

1979 ◽  
Vol 44 ◽  
pp. 41-47
Author(s):  
Donald A. Landman
Keyword(s):  
Real Time ◽  
Computer System ◽  
Spectral Response ◽  
Absolute Intensity ◽  
Solar Observatory ◽  
Target Size ◽  
Small Target ◽  
Signal Averaging ◽  
Quiescent Prominence

This paper describes some recent results of our quiescent prominence spectrometry program at the Mees Solar Observatory on Haleakala. The observations were made with the 25 cm coronagraph/coudé spectrograph system using a silicon vidicon detector. This detector consists of 500 contiguous channels covering approximately 6 or 80 Å, depending on the grating used. The instrument is interfaced to the Observatory’s PDP 11/45 computer system, and has the important advantages of wide spectral response, linearity and signal-averaging with real-time display. Its principal drawback is the relatively small target size. For the present work, the aperture was about 3″ × 5″. Absolute intensity calibrations were made by measuring quiet regions near sun center.

Video real-time imaging of artificial membranes during freeze-drying by cryo-electron microscopy

1988 ◽  
Vol 46 ◽  
pp. 16-17
Author(s):  
Alan S. Rudolph ◽  
Ronald R. Price
Keyword(s):  
Real Time ◽  
Self Assembly ◽  
Freeze Drying ◽  
Video Capture ◽  
Drying Process ◽  
Artificial Membranes ◽  
The Past ◽  
Cryo Electron Microscopy ◽  
Spherical Structures ◽  
Capture Techniques

We have employed cryoelectron microscopy to visualize events that occur during the freeze-drying of artificial membranes by employing real time video capture techniques. Artificial membranes or liposomes which are spherical structures within internal aqueous space are stabilized by water which provides the driving force for spontaneous self-assembly of these structures. Previous assays of damage to these structures which are induced by freeze drying reveal that the two principal deleterious events that occur are 1) fusion of liposomes and 2) leakage of contents trapped within the liposome [1]. In the past the only way to access these events was to examine the liposomes following the dehydration event. This technique allows the event to be monitored in real time as the liposomes destabilize and as water is sublimed at cryo temperatures in the vacuum of the microscope. The method by which liposomes are compromised by freeze-drying are largely unknown. This technique has shown that cryo-protectants such as glycerol and carbohydrates are able to maintain liposomal structure throughout the drying process.

An Interactive Minicomputer Program for the Indexing and Simulation of Electron Diffraction Patterns

1976 ◽  
Vol 34 ◽  
pp. 542-543
Author(s):  
R.P. Goehner ◽  
W.T. Hatfield ◽  
Prakash Rao
Keyword(s):  
Electron Diffraction ◽  
Real Time ◽  
Pattern Analysis ◽  
Flow Diagram ◽  
Hard Copy ◽  
Time Analysis ◽  
Real Time Analysis ◽  
Transmission Electron ◽  
One Step ◽  
Diffraction Patterns

Computer programs are now available in various laboratories for the indexing and simulation of transmission electron diffraction patterns. Although these programs address themselves to the solution of various aspects of the indexing and simulation process, the ultimate goal is to perform real time diffraction pattern analysis directly off of the imaging screen of the transmission electron microscope. The program to be described in this paper represents one step prior to real time analysis. It involves the combination of two programs, described in an earlier paper(l), into a single program for use on an interactive basis with a minicomputer. In our case, the minicomputer is an INTERDATA 70 equipped with a Tektronix 4010-1 graphical display terminal and hard copy unit.A simplified flow diagram of the combined program, written in Fortran IV, is shown in Figure 1. It consists of two programs INDEX and TEDP which index and simulate electron diffraction patterns respectively. The user has the option of choosing either the indexing or simulating aspects of the combined program.

Valence state analysis of elements by EPMA and its application

1990 ◽  
Vol 48 (2) ◽  
pp. 230-231
Author(s):  
Chen Liqing ◽  
Liu Zuqin ◽  
Zhang Wei
Keyword(s):  
Valence State ◽  
Line Intensities ◽  
Valence States ◽  
Valence Electrons ◽  
Fe And Mn ◽  
Intensity Ratios ◽  
State Analysis

Valence state analyses of Fe and Mn in oxides by EPMA have been reported in literature. In this paper, the effects of valence state on intensity ratios ILα/IKα and ILα/ILβ of Cu, Ni, Co, Fe, Mn, Cr and their oxides, and on intensity ratios ILβ2/ILα1 and ILγ1/ILα1 of Mo, Nb, Zr and their oxides were studied. It was observed that intensity ratios change with valence states in accordance with some regularities, and these effects could be utilized for analyzing the valence states of catalysts.Valence state analysis of elements by EPMA is based on the fact that changes in the states of valence electrons in the outer shells of an atom cause corresponding changes in line intensities. The M electrons of Cu, Ni, Co, Fe, Mn, Cr and the N electrons of Mo, Nb, Zr are valence electrons. Line Kα1,2 and six lines of L are produced from the transitions of K-L2,3 and L-M or L-N respectively.

Microstructural investigation of surface roughness in MBE-grown AlAs

1995 ◽  
Vol 53 ◽  
pp. 454-455
Author(s):  
R. Rajesh ◽  
R. Droopad ◽  
C. H. Kuo ◽  
R. W. Carpenter ◽  
G. N. Maracas
Keyword(s):  
Thin Film ◽  
Real Time ◽  
Growth Control ◽  
Native Oxide ◽  
Effusion Cell ◽  
Surface Oxide Layer ◽  
Microstructural Investigation ◽  
Mbe Growth ◽  
Film Substrate ◽  
And Control

Knowledge of material pseudodielectric functions at MBE growth temperatures is essential for achieving in-situ, real time growth control. This allows us to accurately monitor and control thicknesses of the layers during growth. Undesired effusion cell temperature fluctuations during growth can thus be compensated for in real-time by spectroscopic ellipsometry. The accuracy in determining pseudodielectric functions is increased if one does not require applying a structure model to correct for the presence of an unknown surface layer such as a native oxide. Performing these measurements in an MBE reactor on as-grown material gives us this advantage. Thus, a simple three phase model (vacuum/thin film/substrate) can be used to obtain thin film data without uncertainties arising from a surface oxide layer of unknown composition and temperature dependence.In this study, we obtain the pseudodielectric functions of MBE-grown AlAs from growth temperature (650°C) to room temperature (30°C). The profile of the wavelength-dependent function from the ellipsometry data indicated a rough surface after growth of 0.5 μm of AlAs at a substrate temperature of 600°C, which is typical for MBE-growth of GaAs.

Real-time observation of vortex lattices in a superconductor

1993 ◽  
Vol 51 ◽  
pp. 1050-1051
Author(s):  
K. Harada ◽  
T. Matsuda ◽  
J.E. Bonevich ◽  
M. Igarashi ◽  
S. Kondo ◽  
...  
Keyword(s):  
Real Time ◽  
Flux Line ◽  
Electron Holography ◽  
Lorentz Microscopy ◽  
Vortex Lattices ◽  
Flux Lines ◽  
Magnetic Flux Lines ◽  
Time Observation ◽  
Thin Superconductor ◽  
Real Time Observation

Previous observations of magnetic flux-lines (vortex lattices) in superconductors, such as the field distribution of a flux-line, and flux-line dynamics activated by heat and current, have employed the high spatial resolution and magnetic sensitivity of electron holography. And recently, the 2-D static distribution of vortices was also observed by this technique. However, real-time observations of the vortex lattice, in spite of scientific and technological interest, have not been possible due to experimental difficulties. Here, we report the real-time observation of vortex lattices in a thin superconductor, by means of Lorentz microscopy using a 300 kV field emission electron microscope. This technique allows us to observe the dynamic motion of individual vortices and record the events on a VTR system.The experimental arrangement is shown in Fig. 1. A Nb thin film for transmission observation was prepared by chemical etching. The grain size of the film was increased by annealing, and single crystals were observed with a thickness of 50∼90 nm.

Sign in / Sign up

Export Citation Format

Share Document