Analysis and effects of space radiation induced single event transients

Author(s):  
Reinaldo Perez
2018 ◽  
Vol 88-90 ◽  
pp. 936-940 ◽  
Author(s):  
S. Azimi ◽  
L. Sterpone ◽  
B. Du ◽  
L. Boragno

2004 ◽  
Vol 14 (02) ◽  
pp. 327-339 ◽  
Author(s):  
P. Fouillat ◽  
V. Pouget ◽  
D. Lewis ◽  
S. Buchner ◽  
D. McMorrow

This paper describes the use of a pulsed laser for studying radiation-induced single-event transients in integrated circuits. The basic failure mechanisms and the fundamentals of the laser testing method are presented. Sample results are presented to illustrate the benefits of using a pulsed laser for studying single-event transients.


2001 ◽  
Vol 48 (6) ◽  
pp. 2202-2209 ◽  
Author(s):  
R.A. Reed ◽  
C. Poivey ◽  
P.W. Marshall ◽  
K.A. LaBel ◽  
C.J. Marshall ◽  
...  

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