High Current Gain Silicon Carbide Bipolar Power Transistors

Author(s):  
M. Domeij ◽  
Hyung-Seok Lee ◽  
C.-M. Zetterling ◽  
M. Ostling ◽  
A. Schoner
2017 ◽  
Vol 897 ◽  
pp. 655-660
Author(s):  
Dimosthenis Peftitsis ◽  
Jacek Rabkowski ◽  
Hans Peter Nee ◽  
Tore Undeland

The breakdown voltages of the currently available 1.2 and 1.7-kV classes Silicon Carbide (SiC) transistors are not sufficient to operate under medium blocking voltages. On the other hand, the fabrication yields of the available high-voltage SiC transistors are still low, resulting in low current capabilities. Series-connection of several individual transistors is the solution to meet medium blocking voltages and high current ratings. This paper identifies the most crucial design challenges of gate and base drive circuits suitable for driving fast-switching series-connected SiC transistors. These challenges are presented and analyzed using Finite Element Method simulations and experimental investigations.


2015 ◽  
Vol 821-823 ◽  
pp. 810-813 ◽  
Author(s):  
Maxime Berthou ◽  
Dominique Planson ◽  
Dominique Tournier

With the commercial availability of SiC power transistors, this decade will mark an important breakthrough in power transistor technology. However, in power electronic systems, disturbances may place them in short-circuit condition and little knowledge exist about their SC capability. This paper presents our study of SiC MOSFETs, JFETs and BJT under capacitive load short-circuit up to 600V.


Sensors ◽  
2016 ◽  
Vol 16 (1) ◽  
pp. 74 ◽  
Author(s):  
Sang-Won Lee ◽  
Seung-Hwan Cha ◽  
Kyung-Jae Choi ◽  
Byoung-Ho Kang ◽  
Jae-Sung Lee ◽  
...  

1988 ◽  
Vol 9 (10) ◽  
pp. 524-526 ◽  
Author(s):  
R.N. Nottenburg ◽  
Y.-K. Chen ◽  
M.B. Panish ◽  
R. Hamm ◽  
D.A. Humphrey

1987 ◽  
Vol 23 (23) ◽  
pp. 1213
Author(s):  
A. Silard ◽  
F. Floru ◽  
C. Stefan ◽  
G. Nani

Sign in / Sign up

Export Citation Format

Share Document