Transport analysis of filamentary dielectric breakdown model for metal-oxide-semiconductor tunnel structures
2014 ◽
Vol 53
(8S1)
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pp. 08LA01
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2015 ◽
Vol 821-823
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pp. 177-180
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2009 ◽
Vol 48
(2)
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pp. 021206
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2008 ◽
Vol 600-603
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pp. 791-794
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