Identification of GaN Buffer Traps in Microwave Power AlGaN/GaN HEMTs Through Low Frequency S-Parameters Measurements and TCAD-Based Physical Device Simulations
2017 ◽
Vol 5
(3)
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pp. 175-181
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Keyword(s):
2016 ◽
Vol E99.C
(10)
◽
pp. 1147-1155
1999 ◽
2018 ◽
Vol 65
(4)
◽
pp. 1321-1326
◽
Keyword(s):