A Time-Resolved, Low-Noise Single-Photon Image Sensor Fabricated in Deep-Submicron CMOS Technology

IEEE Journal of Solid-State Circuits ◽

10.1109/jssc.2012.2188466 ◽

2012 ◽

Vol 47 (6) ◽

pp. 1394-1407 ◽

Author(s):

Marek Gersbach ◽

Yuki Maruyama ◽

Rahmadi Trimananda ◽

Matt W. Fishburn ◽

David Stoppa ◽

...

Keyword(s):

Single Photon ◽

Cmos Technology ◽

Image Sensor ◽

Deep Submicron ◽

Low Noise ◽

Time Resolved ◽

Download Full-text

Erratum to: “Low-noise design criteria for detector readout systems in deep submicron CMOS technology”

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/s0168-9002(02)00853-7 ◽

2002 ◽

Vol 489 (1-3) ◽

pp. 599

Author(s):

M Manghisoni ◽

L Ratti ◽

V Re ◽

V Speziali

Keyword(s):

Cmos Technology ◽

Deep Submicron ◽

Low Noise ◽

Design Criteria ◽

Submicron Cmos ◽

Low Noise Design

Download Full-text

A Single Photon Avalanche Diode Array Fabricated in Deep-Submicron CMOS Technology

Design, Automation, and Test in Europe ◽

10.1007/978-1-4020-6488-3_29 ◽

2008 ◽

pp. 401-413

Author(s):

Cristiano Niclass ◽

Maximilian Sergio ◽

Edoardo Charbon

Keyword(s):

Single Photon ◽

Cmos Technology ◽

Deep Submicron ◽

Diode Array ◽

Avalanche Diode ◽

Download Full-text

Low-noise design criteria for detector readout systems in deep submicron CMOS technology

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/s0168-9002(01)01831-9 ◽

2002 ◽

Vol 478 (1-2) ◽

pp. 362-366 ◽

Author(s):

M Manghisoni ◽

L Ratti ◽

V Re ◽

V Speziali

Keyword(s):

Cmos Technology ◽

Deep Submicron ◽

Low Noise ◽

Design Criteria ◽

Submicron Cmos ◽

Low Noise Design

Download Full-text

Radiation effects on Single-Photon Avalanche Diodes manufactured in deep submicron CMOS technology

Journal of Physics Conference Series ◽

10.1088/1742-6596/1226/1/012007 ◽

2019 ◽

Vol 1226 ◽

pp. 012007 ◽

Author(s):

M Campajola ◽

F Di Capua ◽

D Fiore ◽

C Nappi ◽

E Sarnelli ◽

...

Keyword(s):

Radiation Effects ◽

Single Photon ◽

Cmos Technology ◽

Deep Submicron ◽

Avalanche Diodes ◽

Submicron Cmos ◽

Single Photon Avalanche Diodes

Download Full-text

A Single Photon Avalanche Diode Array Fabricated in Deep-Submicron CMOS Technology

Proceedings of the Design Automation & Test in Europe Conference ◽

10.1109/date.2006.243987 ◽

2006 ◽

Author(s):

C. Niclass ◽

M. Sergio ◽

E. Charbon

Keyword(s):

Single Photon ◽

Cmos Technology ◽

Deep Submicron ◽

Diode Array ◽

Avalanche Diode ◽

Download Full-text

A Compact Single-Photon Avalanche Diode in a Deep-Submicron CMOS Technology

10.7567/ssdm.2006.b-9-4 ◽

2006 ◽

Author(s):

Hod Finkelstein ◽

Mark J. Hsu ◽

Sadik Esener

Keyword(s):

Single Photon ◽

Cmos Technology ◽

Deep Submicron ◽

Avalanche Diode ◽

Download Full-text

Equivalent circuit models for stacked spiral inductors in deep submicron CMOS technology

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03. ◽

10.1109/iscas.2003.1205682 ◽

2003 ◽

Author(s):

S.C. Rustagi ◽

Chun-Geik Tan

Keyword(s):

Equivalent Circuit ◽

Cmos Technology ◽

Deep Submicron ◽

Spiral Inductors ◽

Submicron Cmos ◽

Equivalent Circuit Models

Download Full-text

Study of SRAM Standby Leakage Reduction Techniques for Deep-submicron CMOS Technology

International Journal of Control and Automation ◽

10.14257/ijca.2017.10.10.05 ◽

2017 ◽

Vol 10 (10) ◽

pp. 49-62

Author(s):

Satyendra Kumar ◽

Kaushik Saha ◽

Hariom Gupta

Keyword(s):

Cmos Technology ◽

Deep Submicron ◽

Leakage Reduction ◽

Reduction Techniques ◽

Download Full-text

Perimeter Gated Single Photon Avalanche Diodes in Sub-Micron and Deep-Submicron CMOS Processes

Selected Topics in Electronics and Systems - High Performance Logic and Circuits for High-Speed Electronic Systems ◽

10.1142/9789811208447_0005 ◽

2019 ◽

pp. 71-89

Author(s):

Mst Shamim Ara Shawkat ◽

Mohammad Habib Ullah Habib ◽

Md Sakib Hasan ◽

Mohammad Aminul Haque ◽

Nicole McFarlane

Keyword(s):

Single Photon ◽

Deep Submicron ◽

Avalanche Diodes ◽

Submicron Cmos ◽

Cmos Processes ◽

Single Photon Avalanche Diodes

Download Full-text

Hot carrier reliability improvement by utilizing phosphorus transient enhanced diffusion for input/output devices of deep submicron CMOS technology

IEEE Electron Device Letters ◽

10.1109/55.887478 ◽

2000 ◽

Vol 21 (12) ◽

pp. 598-600 ◽

Author(s):

H.H.-C. Wang ◽

C.H. Diaz ◽

Boon-Khim Liew ◽

J.Y.-C. Sun ◽

Tahui Wang

Keyword(s):

Cmos Technology ◽

Deep Submicron ◽

Input Output ◽

Hot Carrier ◽

Enhanced Diffusion ◽

Reliability Improvement ◽

Transient Enhanced Diffusion ◽

Download Full-text