scholarly journals Improved Off-State Stress Critical Voltage on AlGaN/GaN High Electron Mobility Transistors Utilizing Pt/Ti/Au Gate Structure

2015 ◽  
Vol 8 (10) ◽  
pp. 104101 ◽  
Author(s):  
Mulagumoottil Jesudas Anand ◽  
Geok Ing Ng ◽  
Subramaniam Arulkumaran ◽  
Binit Syamal ◽  
Xing Zhou

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