Improved Off-State Stress Critical Voltage on AlGaN/GaN High Electron
Mobility Transistors Utilizing Pt/Ti/Au Gate Structure
2011 ◽
Vol 14
(7)
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pp. H264
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2021 ◽
Vol 135
◽
pp. 106109
2011 ◽
Vol 29
(6)
◽
pp. 060603
◽
1998 ◽
Vol 37
(Part 1, No. 3B)
◽
pp. 1365-1372
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