Improved Off-State Stress Critical Voltage on AlGaN/GaN High Electron Mobility Transistors Utilizing Pt/Ti/Au Based Gate Metallization
2011 ◽
Vol 14
(7)
◽
pp. H264
◽
2011 ◽
Vol 29
(6)
◽
pp. 060603
◽
2010 ◽
Vol 50
(6)
◽
pp. 767-773
◽
2008 ◽
Vol 29
(4)
◽
pp. 287-289
◽