scholarly journals Corrections for “A Mixed-Signal Circuit Technique for Cancellation of Multiple Modulated Spurs in 4G/5G Carrier Aggregation Transceivers”

2020 ◽  
Vol 3 ◽  
pp. 33-33
Author(s):  
Silvester Sadjina ◽  
Ram Sunil Kanumalli ◽  
Krzysztof Dufrene ◽  
Mario Huemer ◽  
Harald Pretl
2019 ◽  
Vol 2 (11) ◽  
pp. 260-263 ◽  
Author(s):  
Silvester Sadjina ◽  
Ram Sunil Kanumalli ◽  
Krzysztof Dufrene ◽  
Mario Huemer ◽  
Harald Pretl

2018 ◽  
Vol 65 (11) ◽  
pp. 3745-3755 ◽  
Author(s):  
Silvester Sadjina ◽  
Ram Sunil Kanumalli ◽  
Andreas Gebhard ◽  
Krzysztof Dufrene ◽  
Mario Huemer ◽  
...  

2013 ◽  
Vol E96.B (6) ◽  
pp. 1297-1305
Author(s):  
Takahiro TAKIGUCHI ◽  
Kohei KIYOSHIMA ◽  
Yuta SAGAE ◽  
Kengo YAGYU ◽  
Hiroyuki ATARASHI ◽  
...  

Author(s):  
Keisuke SAITO ◽  
Yuichi KAKISHIMA ◽  
Teruo KAWAMURA ◽  
Yoshihisa KISHIYAMA ◽  
Hidekazu TAOKA ◽  
...  

2013 ◽  
Vol 61 (3) ◽  
pp. 691-696 ◽  
Author(s):  
R. Suszynski ◽  
K. Wawryn

Abstract A rapid prototyping method for designing mixed signal systems has been presented in the paper. The method is based on implementation of the field programmable analog array (FPAA) to configure and reconfigure mixed signal systems. A serial algorithmic analog digital converter has been used as an example. Three converter architectures have been selected and implemented FPAA device. To verify and illustrate converters operation and prototyping capabilities, implemented converters have been excited by a sinusoidal signal. Analog sinusoidal excitations, digital responses and sinusoidal waveforms after reconstruction are presented.


2012 ◽  
Vol 1 (1) ◽  
pp. 1-7
Author(s):  
Vadim Geurkov ◽  
◽  
Lev Kirischian ◽  
Keyword(s):  

Author(s):  
Chunyu Zhang ◽  
Lakshmi Vedula ◽  
Shekhar Khandekar

Abstract Latch-up induced during High Temperature Operating Life (HTOL) test of a mixed signal device fabricated with 1.0 μm CMOS, double poly, double metal process caused failures due to an open in aluminum metal line. Metal lines revealed wedge voids of about 50% of the line width. Triggering of latch up mechanism during the HTOL test resulted in a several fold increase of current flowing through the ground metal line. This increase in current resulted in the growth of the wedge voids leading to failures due to open metal lines.


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