scholarly journals Impact of analog IC impairments in SiPM interface electronics

Author(s):  
Samrat Dey ◽  
Thomas K. Lewellen ◽  
Robert S. Miyaoka ◽  
Jacques C. Rudell
Keyword(s):  
Author(s):  
Fubin Zhang ◽  
David Maxwell

Abstract Based on the understanding of laser based techniques’ physics theory and the topology/structure of analog circuit systems with feedback loops, the propagation of laser induced voltage/current alteration inside the analog IC is evaluated. A setup connection scheme is proposed to monitor this voltage/current alteration to achieve a better success rate in finding the fail site or defect. Finally, a case of successful isolation of a high resistance via on an analog device is presented.


2020 ◽  
Author(s):  
António Gusmão ◽  
Nuno Horta ◽  
Nuno Lourenço ◽  
Ricardo Martins

2014 ◽  
Vol 496-500 ◽  
pp. 1176-1179
Author(s):  
Li Tan ◽  
Yu Fang

LTX-77 test system is a large IC test system that is used for various kinds of analog IC, digital IC and analog digital mixed IC. It can be used to test DC parameters, AC parameters and logic functions. In the paper, the IC test platform is LTX-77 test system. IC ADC0804 was tested as the test object. The test method of IC is described in the view of actual test. The test results show that the test system is convenient and accurate, which has important practical value for IC manufacturers and users.


1985 ◽  
Vol 15 (3) ◽  
pp. 11-15 ◽  
Author(s):  
Charles A. Shaw
Keyword(s):  

Author(s):  
Yaguang Li ◽  
Yishuang Lin ◽  
Meghna Madhusudan ◽  
Arvind Sharma ◽  
Wenbin Xu ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document