On the Exploration of Design Tradeoffs in Analog IC Placement with Layout-dependent Effects

2019 ◽  
Author(s):  
Ricardo Martins ◽  
Nuno Loureneo ◽  
Ricardo Povoa ◽  
Nuno Horta
Keyword(s):  
Analog Ic ◽  
Design Tradeoffs

Laser Based Analysis on Analog Circuits with Feedback Loops and a Case Study

2006 ◽  
Author(s):  
Fubin Zhang ◽  
David Maxwell
Keyword(s):  
Success Rate ◽  
High Resistance ◽  
Analog Circuits ◽  
Analog Circuit ◽  
Feedback Loops ◽  
Induced Voltage ◽  
Analog Device ◽  
Analog Ic ◽  
Successful Isolation

Abstract Based on the understanding of laser based techniques’ physics theory and the topology/structure of analog circuit systems with feedback loops, the propagation of laser induced voltage/current alteration inside the analog IC is evaluated. A setup connection scheme is proposed to monitor this voltage/current alteration to achieve a better success rate in finding the fail site or defect. Finally, a case of successful isolation of a high resistance via on an analog device is presented.

Design Tradeoffs of High Performance DSPs for General-Purpose HPC

2014 ◽  
Vol 36 (4) ◽  
pp. 790-798
Author(s):  
Kai ZHANG ◽  
Shu-Ming CHEN ◽  
Yao-Hua WANG ◽  
Xi NING
Keyword(s):  
High Performance ◽  
General Purpose ◽  
Design Tradeoffs

Analog IC Placement Generation via Neural Networks from Unlabeled Data

2020 ◽  
Author(s):  
António Gusmão ◽  
Nuno Horta ◽  
Nuno Lourenço ◽  
Ricardo Martins
Keyword(s):  
Neural Networks ◽  
Unlabeled Data ◽  
Analog Ic

Process limitation and device design tradeoffs of self-aligned TiSi/sub 2/ junction formation in submicrometer CMOS devices

1991 ◽  
Vol 38 (2) ◽  
pp. 246-254 ◽  
Author(s):  
C.-Y. Lu ◽  
J.J. Sung ◽  
R. Liu ◽  
N.-S. Tsai ◽  
R. Sing ◽  
...  
Keyword(s):  
Device Design ◽  
Junction Formation ◽  
Design Tradeoffs

Design Tradeoffs Between Stator Core Loss and Torque Ripple in IPM Machines

2010 ◽  
Vol 46 (1) ◽  
pp. 187-195 ◽  
Author(s):  
Seok-Hee Han ◽  
Thomas M. Jahns ◽  
Z. Q. Zhu
Keyword(s):  
Core Loss ◽  
Torque Ripple ◽  
Stator Core ◽  
Design Tradeoffs

The Research of IC Test Based on LTX-77 Test System

2014 ◽  
Vol 496-500 ◽  
pp. 1176-1179
Author(s):  
Li Tan ◽  
Yu Fang
Keyword(s):  
Test Object ◽  
Test System ◽  
Test Method ◽  
Test Results ◽  
Analog Ic ◽  
Test Platform ◽  
Logic Functions ◽  
Actual Test ◽  
Ic Test

LTX-77 test system is a large IC test system that is used for various kinds of analog IC, digital IC and analog digital mixed IC. It can be used to test DC parameters, AC parameters and logic functions. In the paper, the IC test platform is LTX-77 test system. IC ADC0804 was tested as the test object. The test method of IC is described in the view of actual test. The test results show that the test system is convenient and accurate, which has important practical value for IC manufacturers and users.

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