Accelerator IGUR-3 in the mode of electron beam pulse generation

Author(s):  
A.I. Kormilitsyn ◽  
V.S. Diyankov ◽  
V.I. Martynov ◽  
V.B. Bratchikov ◽  
A.S. Ganeev ◽  
...  
2008 ◽  
Vol 26 (4) ◽  
pp. 605-617 ◽  
Author(s):  
V.F. Tarasenko ◽  
E.H. Baksht ◽  
A.G. Burachenko ◽  
I.D. Kostyrya ◽  
M.I. Lomaev ◽  
...  

AbstractThis paper reports on the properties of a supershort avalanche electron beam generated in the air or other gases under atmospheric pressure and gives the analysis of a generation mechanism of supershort avalanche electron beam, as well as methods of such electron beams registration. It is reported that in the air under the pressure of 1 atm, a supershort (<100 ps) avalanche electron beam is formed in the solid angle more than 2π steradian. The electron beam has been obtained behind a 45 µm thick Al-Be foil in SF6 and Xe under the pressure of 2 atm, and in He, under the pressure of about 15 atm. It is shown that in SF6 under the high pressure (>1 atm) duration (full width at half maximum) of supershort avalanche electron beam pulse is about 150 ps.


2020 ◽  
Vol 65 (3) ◽  
pp. 1062-1069
Author(s):  
G.A. Casillas-Pérez ◽  
S. Jeyakumar ◽  
A. Carrillo-Vargas ◽  
H.R. Pérez-Enríquez

2016 ◽  
Author(s):  
A. A. Vasilyev ◽  
A. S. Arakcheev ◽  
I. A. Bataev ◽  
V. A. Bataev ◽  
A. V. Burdakov ◽  
...  

1984 ◽  
Vol 35 ◽  
Author(s):  
M.S. Doghmane ◽  
D. Barbier ◽  
A. Laugier

ABSTRACTAu/Si Schottky contacts have been used as test structures to investigate defects induced in virgin C.Z (100) N-type silicon after irradiation with a 12 to 20 KeV mean energy electron beam pulse. A thin and highly damaged surface layer was observed from a fluence threshold of 1 J/cm2. In addition electron traps were detected in the PEBA induced melting layer with concentrations in the 1012-1013 cm-3 range. Their depth profiles have been related to the PEBA induced melting layer thickness. Quenching of multidefect complexes is the most probable mechanism for electron trap generation in the processed layer.


2016 ◽  
Vol 120 (8) ◽  
pp. 085103 ◽  
Author(s):  
Z. Werner ◽  
M. Barlak ◽  
R. Ratajczak ◽  
P. Konarski ◽  
A. M. Markov ◽  
...  

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