The conversion model of low dose rate effect in bipolar transistors

Author(s):  
V. S. Pershenkov ◽  
D. V. Savchenkov ◽  
A. S. Bakerenkov ◽  
V. N. Ulimov ◽  
A. Y. Nikiforov ◽  
...  
2020 ◽  
Vol 33 (2) ◽  
pp. 303-316
Author(s):  
Vyacheslav Pershenkov ◽  
Alexander Bakerenkov ◽  
Alexander Rodin ◽  
Vladislav Felitsyn ◽  
Alexander Zhukov ◽  
...  

Possible physical mechanism of enhanced low dose rate sensitivity (ELDRS) and reduced low dose rate sensitivity (RLDRS) in bipolar devices is described. Modification of the low dose rate conversion model is presented. The enhanced or reduced sensitivity can be connected with a specific position of the effective Fermi level relatively acceptor and donor radiation-induced interface traps. The qualitative and quantitative analysis of the low dose rate effects is presented. The effect of the oxide trapped charge on the value of the oxide electric field and the yield of the oxide charge were taken into account. It leads to dependence of the accumulation of radiation induced oxide charge and interface traps on the dose rate. In enhancement version the ELDRS and RLDRS conversion model describes the low dose rate effect in as ?true? dose rate effect.


2006 ◽  
Vol 53 (6) ◽  
pp. 3655-3660 ◽  
Author(s):  
J. Boch ◽  
F. Saigne ◽  
R. D. Schrimpf ◽  
J.-R. Vaille ◽  
L. Dusseau ◽  
...  

1998 ◽  
Vol 540 ◽  
Author(s):  
J. I. Cole ◽  
T. R. Allen

AbstractChanges in mechanical and corrosion properties caused by the development of radiation-induced microstructures have relevance to the aging and lifetime extension of light water reactors (LWR‘s). However, much of the current data related to microstructural development in irradiated metals are generated from studies carried out at much higher dose-rates than encountered in LWR‘s. An opportunity exists to study the influence of low dose-rate irradiation on microstructural development for a variety of structural and surveillance materials extracted from the experimental breeder reactor EBR-lI. In this study, irradiated 304 stainless steel hexagonal “hex” duct material is examined in order to compare microstructures in the dose-rate range of 10−7 - 10−9 dpa/sec. The samples, taken from the reflector locations in EBR-II, experienced a total dose between 10 and 12 dpa at a temperature of ∼375 °C. Transmission electron microscopy (TEM) analysis reveals that there is a moderate dose-rate effect on microstructural development for samples irradiated in the range of 2 × 10−8 to 4 × 10−8. dpa/sec, however a substantial dose-rate effect exists between dose-rates of 2 × 10−8 and 1 × 10−9 dpa/sec Results detail the development of the microstructure in terms of radiation-induced cavities, dislocations, and precipitates.


Author(s):  
V. S. Pershenkov ◽  
A. S. Bakerenkov ◽  
V. A. Telets ◽  
V. V. Belyakov ◽  
V. A. Felitsyn ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document