2009 European Conference on Radiation and Its Effects on Components and Systems
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128
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9781457704925
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Fast SER evaluation of embedded RAMs in fault emulation systems

2009 ◽  
Author(s):  
Marta Portela-Garcia ◽  
Celia Lopez-Ongil ◽  
Mario Garcia-Valderas ◽  
Enrique San Millan ◽  
Luis Entrena
Keyword(s):  
Fault Emulation

A deep level transient spectroscopy study of electron and proton irradiated p+n GaAs diodes

2009 ◽  
Author(s):  
Jeffrey H. Warner ◽  
Scott R. Messenger ◽  
Robert J. Walters ◽  
Steve A. Ringel ◽  
Mark R. Brenner
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Spectroscopy Study ◽  
Transient Spectroscopy

In flight observation of proton induced destructive single event phenomena

2009 ◽  
Author(s):  
Francoise Bezerra ◽  
Eric Lorfevre ◽  
Robert Ecoffet ◽  
Daniel Peyre ◽  
Christain Binois ◽  
...  
Keyword(s):  
Single Event

The conversion model of low dose rate effect in bipolar transistors

2009 ◽  
Author(s):  
V. S. Pershenkov ◽  
D. V. Savchenkov ◽  
A. S. Bakerenkov ◽  
V. N. Ulimov ◽  
A. Y. Nikiforov ◽  
...  
Keyword(s):  
Dose Rate ◽  
Low Dose ◽  
Bipolar Transistors ◽  
Rate Effect ◽  
Conversion Model ◽  
Low Dose Rate ◽  
Dose Rate Effect

Single event upset and multiple cell upset modeling in commercial bulk 65 nm CMOS SRAMs and flip-flops

2009 ◽  
Author(s):  
Slawosz Uznanski ◽  
Gilles Gasiot ◽  
Philippe Roche ◽  
Clement Tavernier ◽  
Jean-Luc Autran
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Multiple Cell

Fault tolerant FIR filters using hamming codes

2009 ◽  
Author(s):  
Shih-Fu Liu ◽  
Pedro Reviriego ◽  
Juan Antonio Maestro
Keyword(s):  
Fault Tolerant ◽  
Fir Filters ◽  
Hamming Codes

Inner belt anisotropy investigations based on the Standard Radiation Environment Monitor (SREM)

2009 ◽  
Author(s):  
M. Siegl ◽  
H. D. R. Evans ◽  
E. J. Daly ◽  
G. Santin ◽  
P. Nieminen ◽  
...  
Keyword(s):  
Radiation Environment

Characterization of new radiation hardened bipolar operational amplifiers

2009 ◽  
Author(s):  
Geraldine Chaumont ◽  
Benoit Cornanguer ◽  
Patrick Briand ◽  
Christophe Prugne ◽  
Florence Malou
Keyword(s):  
Operational Amplifiers ◽  
Radiation Hardened

Modeling of ionizing radiation-induced degradation in multiple gate field effect transistors

2009 ◽  
Author(s):  
Ivan S. Esqueda ◽  
Hugh J. Barnaby ◽  
Keith E. Holbert ◽  
Farah E. Mamouni ◽  
Ronald D. Schrimpf
Keyword(s):  
Ionizing Radiation ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Radiation Induced
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