2009 European Conference on Radiation and Its Effects on Components and Systems
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128

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7

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Published By IEEE

9781457704925

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Inner belt anisotropy investigations based on the Standard Radiation Environment Monitor (SREM)

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994710 ◽

2009 ◽

Author(s):

M. Siegl ◽

H. D. R. Evans ◽

E. J. Daly ◽

G. Santin ◽

P. Nieminen ◽

...

Keyword(s):

Radiation Environment

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Characterization of new radiation hardened bipolar operational amplifiers

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994727 ◽

2009 ◽

Author(s):

Geraldine Chaumont ◽

Benoit Cornanguer ◽

Patrick Briand ◽

Christophe Prugne ◽

Florence Malou

Keyword(s):

Operational Amplifiers ◽

Radiation Hardened

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Modeling of ionizing radiation-induced degradation in multiple gate field effect transistors

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994543 ◽

2009 ◽

Author(s):

Ivan S. Esqueda ◽

Hugh J. Barnaby ◽

Keith E. Holbert ◽

Farah E. Mamouni ◽

Ronald D. Schrimpf

Keyword(s):

Ionizing Radiation ◽

Field Effect ◽

Field Effect Transistors ◽

Radiation Induced

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Effects of proton and ion beam irradiation on titanium dioxide memristors

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994554 ◽

2009 ◽

Author(s):

Milos Vujisic ◽

Koviljka Stankovic ◽

Predrag Osmokrovic

Keyword(s):

Titanium Dioxide ◽

Ion Beam ◽

Beam Irradiation ◽

Ion Beam Irradiation

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Analysis of SET propagation in flash-based FPGAs by means of electrical pulse injection

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994559 ◽

2009 ◽

Author(s):

N. Battezzati ◽

L. Sterpone ◽

V. Ferlet-Cavrois

Keyword(s):

Electrical Pulse ◽

Pulse Injection

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The conversion model of low dose rate effect in bipolar transistors

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994661 ◽

2009 ◽

Author(s):

V. S. Pershenkov ◽

D. V. Savchenkov ◽

A. S. Bakerenkov ◽

V. N. Ulimov ◽

A. Y. Nikiforov ◽

...

Keyword(s):

Dose Rate ◽

Low Dose ◽

Bipolar Transistors ◽

Rate Effect ◽

Conversion Model ◽

Low Dose Rate ◽

Dose Rate Effect

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Single event upset and multiple cell upset modeling in commercial bulk 65 nm CMOS SRAMs and flip-flops

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994579 ◽

2009 ◽

Author(s):

Slawosz Uznanski ◽

Gilles Gasiot ◽

Philippe Roche ◽

Clement Tavernier ◽

Jean-Luc Autran

Keyword(s):

Single Event Upset ◽

Single Event ◽

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Fault tolerant FIR filters using hamming codes

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994701 ◽

2009 ◽

Author(s):

Shih-Fu Liu ◽

Pedro Reviriego ◽

Juan Antonio Maestro

Keyword(s):

Fault Tolerant ◽

Fir Filters ◽

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Using Oxide-Trap Charge-Pumping method in radiation reliability analysis of short lightly doped drain transistor

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994552 ◽

2009 ◽

Author(s):

Boualem Djezzar ◽

Hakim Tahi

Keyword(s):

Reliability Analysis ◽

Trap Charge ◽

Charge Pumping ◽

Lightly Doped Drain

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Fast SER evaluation of embedded RAMs in fault emulation systems

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994590 ◽

2009 ◽

Author(s):

Marta Portela-Garcia ◽

Celia Lopez-Ongil ◽

Mario Garcia-Valderas ◽

Enrique San Millan ◽

Luis Entrena

Keyword(s):

Fault Emulation

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