Designing a reliability test plan using customer usage and bench life test data

2005 ◽  
Author(s):  
Wenzhen Yan ◽  
Jianxiong Chen ◽  
A.T. Herfat
Keyword(s):  
Test Data ◽  
Reliability Test ◽  
Test Plan ◽  
Life Test

Design of a Zero-Failure Reliability Test Plan Based on Customer Usage and Bench Life Test Data

2006 ◽  
Vol 49 (2) ◽  
pp. 93-103
Author(s):  
Jianxiong Chen ◽  
Wenzhen Yan
Keyword(s):  
Monte Carlo Simulation ◽  
Test Data ◽  
New Products ◽  
Test Method ◽  
Reliability Test ◽  
Distribution Analysis ◽  
Test Plan ◽  
Life Test ◽  
Product Service

Reliability tests are mandatory to evaluate new products prior to their release. The proper determination of a reliability test plan is crucial because an erroneous test plan can be very costly and misleading. This paper describes a probability-based method of designing a reliability demonstration test plan using both field customer usage and historical bench life test data. Statistical distribution analysis, Monte Carlo simulation (MCS) technique, and zero-failure test method are integrated into the probability-based method to create test plans that can more accurately evaluate product reliabilities for the required product service life using a small number of test samples.

scholarly journals Truncated Life Test Plans for Economic Reliability Based on Four-Parametric Burr Distribution

2013 ◽  
Vol 2013 ◽  
pp. 1-6
Author(s):  
Ramkumar Balan ◽  
Sajana Kunjunni
Keyword(s):  
Probability Model ◽  
Reliability Test ◽  
Test Plan ◽  
Life Test ◽  
Producer’S Risk ◽  
Sampling Plans ◽  
Burr Distributions ◽  
Burr Distribution ◽  
Truncated Life Test ◽  
Termination Time

Burr distribution is considered as a probability model for the lifetime of products. Reliability test plans are those sampling plans in which items from a lot are put to test to make conclusions on the estimate of life, and hence acceptance or rejection of the submitted lot is done. A test plan designs the termination time of the experiment and the termination number for a given sample size and producer’s risk. Tables and graphs were provided for certain specific values of designs, and it is useful to verify the optimum reliability test plan realized by Burr distributions.

Study of High-Power White LED's Lifetime Based on Accelerated Life Test

2013 ◽  
Vol 800 ◽  
pp. 205-209 ◽  
Author(s):  
De Sheng Li ◽  
Nian Yu Zou ◽  
Yun Cui Zhang ◽  
Xiao Yang He ◽  
Yi Yang
Keyword(s):  
High Power ◽  
Accelerated Life Test ◽  
Reliability Test ◽  
White Led ◽  
Life Test ◽  
Arrhenius Model ◽  
White Leds ◽  
Accelerated Life ◽  
Temperature Levels

The study of LED reliability becomes more and more important with LED widely used in various areas, and accelerated life test (ALT) as an element of reliability test is widely used to predict the lifetime of LED. In this paper, ALTs have been carried out at various current levels and various temperature levels. In the current ALT experiment, three kinds of stressing currents were demonstrated for 1W white LEDs and lumen flux of the tested LEDs were studied, and based on Eyting model, lifetime of the tested LEDs is calculated about 6.86×105h. In the temperature ALT experiment, two kinds of stressing temperature were demonstrated for the same type of white LEDs and lumen flux were also studied, and based on Arrhenius model, lifetime of the tested LEDs is calculated about 7.41×105h. In addition, the color shifting velocity is faster than lumens depreciation velocity was observed in our experiment, which means the lifetime evaluating of white LED should be paid more attention.

Durability and Reliability Test Planning and Test Data Analysis

2013 ◽  
Vol 7 (1) ◽  
pp. 84-95
Author(s):  
Zhigang Wei ◽  
Shengbin Lin ◽  
Limin Luo ◽  
Fulun Yang ◽  
Dmitri Konson ◽  
...  
Keyword(s):  
Data Analysis ◽  
Test Data ◽  
Reliability Test ◽  
Test Planning

Optimum time-censored simple ramp-stress accelerated life test sampling plan for the log-logistic distribution

2015 ◽  
Vol 21 (1) ◽  
pp. 112-132 ◽  
Author(s):  
Preeti Wanti Srivastava ◽  
Deepmala Sharma
Keyword(s):  
Sample Size ◽  
Asymptotic Variance ◽  
Sampling Plan ◽  
Accelerated Life Test ◽  
Test Plan ◽  
Life Test ◽  
Life Distribution ◽  
Optimal Test ◽  
Content Type ◽  
Accelerated Life

Purpose – Acceptance sampling plans are designed to decide about acceptance or rejection of a lot of products on the basis of sample drawn from it. Accelerating the life test helps in obtaining information about the lifetimes of high reliability products quickly. The purpose of this paper is to formulate an optimum time censored acceptance sampling plan based on ramp-stress accelerated life test (ALT) for items having log-logistic life distribution. The log-logistic life distribution has been found appropriate for highly reliable components such as power system components and insulating materials. Design/methodology/approach – The inverse power relationship has been used to model stress-life relationship. It is meant for analyzing data for which the accelerated stress is nonthermal in nature, and frequently used as an accelerating stress for products such as capacitors, transformers, and insulators. The method of maximum likelihood is used for estimating design parameters. The optimal test plan is obtained by minimizing variance of test-statistic that decides on acceptability or rejectibility of lot. The optimal test plan finds optimal sample size, stress rates, sample proportion allocated to each stress and lot acceptability constant such that producer’s risk and consumer’s risk is satisfied. Findings – Asymptotic variance plays a pivotal role in determining the sample size required for a sampling plan for deciding the acceptance/rejection of a lot. The sample size is minimized by optimally designing a ramp-stress ALT so that the asymptotic variance is minimized. Originality/value – The model suggested is of use to quality control and reliability engineers dealing with highly reliable items.

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