Results of Single-Event Transient Measurements Conducted by the Jet Propulsion Laboratory

2008 ◽  
Author(s):  
Farokh Irom ◽  
Tetsuo F. Miyahira
Keyword(s):  
Single Event ◽  
Single Event Transient ◽  
Jet Propulsion ◽  
Jet Propulsion Laboratory ◽  
Transient Measurements

Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion Laboratory

2010 ◽  
Author(s):  
Steven S. McClure ◽  
Gregory R. Allen ◽  
Farokh Irom ◽  
Leif Z. Scheick ◽  
Philippe C. Adell ◽  
...  
Keyword(s):  
Test Results ◽  
Single Event ◽  
Jet Propulsion ◽  
Single Event Effect ◽  
Jet Propulsion Laboratory

Single-Event Transient Measurements in nMOS and pMOS Transistors in a 65-nm Bulk CMOS Technology at Elevated Temperatures

2011 ◽  
Vol 11 (1) ◽  
pp. 179-186 ◽  
Author(s):  
Matthew J. Gadlage ◽  
Jonathan R. Ahlbin ◽  
Balaji Narasimham ◽  
Bharat L. Bhuva ◽  
Lloyd W. Massengill ◽  
...  
Keyword(s):  
Elevated Temperatures ◽  
Cmos Technology ◽  
Single Event ◽  
Single Event Transient ◽  
Transient Measurements

Alpha-Particle and Focused-Ion-Beam-Induced Single-Event Transient Measurements in a Bulk 65-nm CMOS Technology

2011 ◽  
Vol 58 (3) ◽  
pp. 1093-1097 ◽  
Author(s):  
Matthew J. Gadlage ◽  
Jonathan R. Ahlbin ◽  
Bharat L. Bhuva ◽  
Nicholas C. Hooten ◽  
Nathaniel A. Dodds ◽  
...  
Keyword(s):  
Alpha Particle ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Cmos Technology ◽  
Single Event ◽  
Single Event Transient ◽  
Transient Measurements
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