Single Event Dielectric Rupture Characterization of Microchip High Voltage Devices

Author(s):  
D. Truyen ◽  
S. Furic ◽  
E. Leduc
Keyword(s):  
Xenobiotica ◽  
1981 ◽  
Vol 11 (12) ◽  
pp. 841-847 ◽  
Author(s):  
J. A. Bell ◽  
A. Bradbury ◽  
L. E. Martin ◽  
R. J. N. Tanner

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