Simulation of Thermal Transport in Nanowire Composites for Macro-Electronics Applications

Author(s):  
Satish Kumar ◽  
Jayathi Y. Murthy ◽  
M. A. Alam

Thermal transport in thin film transistors (TFTs) composed of nanowires embedded in plastic substrates is considered. Random ensembles of intersecting and contacting wires embedded in a substrate are analyzed using Fourier theory. Heat generation due to self-heating is included. A finite volume scheme is used to obtain the temperature solutions in the wires and substrate. Temperature profiles in the ensemble are investigated as a function of wire number density, wire-contact Biot number as well as the Biot number for heat transfer to the substrate.

2018 ◽  
Vol 28 (4) ◽  
pp. 247-253
Author(s):  
Dae-Gyu Yang ◽  
Hyoung-Do Kim ◽  
Jong-Heon Kim ◽  
Hyun-Suk Kim

Author(s):  
Mengjun Du ◽  
Jinfeng Zhao ◽  
Dongli Zhang ◽  
Huaisheng Wang ◽  
Qi Shan ◽  
...  

2018 ◽  
Vol 6 (48) ◽  
pp. 13359-13366 ◽  
Author(s):  
Joo-Young Kim ◽  
Ji Whan Kim ◽  
Eun Kyung Lee ◽  
Jeong-Il Park ◽  
Bang-Lin Lee ◽  
...  

This paper reports a polymeric gate insulating material of poly(hydroxy imide) cured at the low temperature of 130 °C for the application to organic thin-film transistors on plastic substrates exhibiting high breakdown voltage and no hysteresis.


2019 ◽  
Vol 85 (1) ◽  
pp. 277-283 ◽  
Author(s):  
Rawad K. Hallani ◽  
Maximilian Moser ◽  
Helen Bristow ◽  
Maud V. C. Jenart ◽  
Hendrik Faber ◽  
...  

2003 ◽  
Vol 769 ◽  
Author(s):  
Lihong Teng ◽  
Wayne A. Anderson

AbstractThe properties of thin film transistors (TFT's) on plastic substrates with active silicon films deposited by microwave ECR-CVD were studied. Two types of plastic were used, PEEK and polyimide. The a-Si:H TFT deposited at 200°C on polyimide substrates showed a saturation field effect mobility of 4.5 cm2/V-s, a threshold voltage of 3.7 V, a subthreshold swing of 0.69 V/dec and an ON/OFF current ratio of 7.9×106, while the TFT fabricated on PEEK at 200°C showed a saturation field effect mobility of 3.9 cm2/V-s, a threshold voltage of 4.1 V, a subthreshold swing of 0.73 V/dec and an ON/OFF current ratio of 4×106. Comparison is made to TFT's with the Si deposited at 400°C on glass.


2004 ◽  
Vol 33 (4) ◽  
pp. 353-357 ◽  
Author(s):  
D. Shahrjerdi ◽  
B. Hekmatshoar ◽  
S. S. Mohajerzadeh ◽  
A. Khakifirooz ◽  
M. Robertson

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