Plasma-Nitrided Ga2O3(Gd2O3) as Interfacial Passivation Layer for InGaAs Metal–Oxide– Semiconductor Capacitor With HfTiON Gate Dielectric
2015 ◽
Vol 62
(4)
◽
pp. 1235-1240
◽
2018 ◽
Vol 65
(1)
◽
pp. 72-78
◽
2017 ◽
Vol 11
(9)
◽
pp. 1700180
◽
2017 ◽
Vol 17
(2)
◽
pp. 458-462
◽
2016 ◽
Vol 10
(9)
◽
pp. 703-707
◽
2014 ◽
Vol 61
(3)
◽
pp. 742-746
◽