Stable and High-Performance Indium Oxide Thin-Film Transistor by Ga Doping

2016 ◽  
Vol 63 (3) ◽  
pp. 1078-1084 ◽  
Author(s):  
Youn Goo Kim ◽  
Taehun Kim ◽  
Christophe Avis ◽  
Seung-Hun Lee ◽  
Jin Jang
2014 ◽  
Vol 852 ◽  
pp. 319-323
Author(s):  
Xin An Zhang ◽  
Xian Kun Yu ◽  
Jun Xia Zhai ◽  
Yang Jiao ◽  
Ling Hong Ding ◽  
...  

We report on the fabrication of bottom gate thin film transistors with indium oxide (In2O3) thin films as the active channel layers. The films were deposited on SiO2/Si substrate at room temperature by direct current (DC) magnetron sputtering. The ITO films were used as source and drain electrodes. The In2O3 films were structurally characterized by x-ray diffraction (XRD) and scanning electron microscopy (SEM) techniques. The results revealed that the films were amorphous in nature. Electrical measurement has revealed that the devices operate as an n-channel enhancement mode and exhibit an on/off ratio of 106. The threshold voltage is-3V and the channel mobility on the order of 22.3 cm2/Vs has been determined.


2008 ◽  
Vol 130 (38) ◽  
pp. 12580-12581 ◽  
Author(s):  
Hyun Sung Kim ◽  
Paul D. Byrne ◽  
Antonio Facchetti ◽  
Tobin J. Marks

2020 ◽  
Vol 116 (18) ◽  
pp. 182104 ◽  
Author(s):  
Dun-Bao Ruan ◽  
Po-Tsun Liu ◽  
Kai-Jhih Gan ◽  
Yu-Chuan Chiu ◽  
Chih-Chieh Hsu ◽  
...  

2019 ◽  
Vol 66 (8) ◽  
pp. 3554-3559 ◽  
Author(s):  
Peng Yang ◽  
Guangshuo Cai ◽  
Xinzhong Wang ◽  
Yanli Pei

2016 ◽  
Vol 4 (10) ◽  
pp. 2072-2078 ◽  
Author(s):  
Yuzhi Li ◽  
Linfeng Lan ◽  
Peng Xiao ◽  
Zhenguo Lin ◽  
Sheng Sun ◽  
...  

Facile patterning of chloride-based precursor films for low-temperature, high performance indium oxide thin-film transistors.


2015 ◽  
Vol 3 (4) ◽  
pp. 854-860 ◽  
Author(s):  
Chang-Ho Choi ◽  
Seung-Yeol Han ◽  
Yu-Wei Su ◽  
Zhen Fang ◽  
Liang-Yu Lin ◽  
...  

In this study, we fabricate amorphous indium oxide thin film transistors (TFTs) on a display glass substrate at various annealing temperatures from 200 °C to 300 °C.


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