Exploiting path delay test generation to develop better TDF tests for small delay defects

2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems ◽

Techniques to Improve the Efficiency of SAT Based Path Delay Test Generation

10.1109/vlsid.2014.16 ◽

2014 ◽

Cited By ~ 1

Author(s):

Kun Bian ◽

D.M.H. Walker ◽

Sunil P. Khatri

Keyword(s):

Test Generation ◽

Path Delay ◽

Delay Test ◽

A Novel Test Generation Method for Small-Delay Defects with User-Defined Fault Model

2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2019.8741773 ◽

2019 ◽

Author(s):

Chao-Jun Shang ◽

Cheng-Hung Wu ◽

Kuen-Jong Lee ◽

Yu-Hsiang Chen

Keyword(s):

Test Generation ◽

Fault Model ◽

Small Delay Defects ◽

Small Delay ◽

Delay Test and Small-Delay Defects

Test and Diagnosis for Small-Delay Defects ◽

10.1007/978-1-4419-8297-1_2 ◽

2011 ◽

pp. 21-36 ◽

Cited By ~ 5

Author(s):

Mohammad Tehranipoor ◽

Ke Peng ◽

Krishnendu Chakrabarty

Keyword(s):

Delay Test ◽

Small Delay Defects ◽

Small Delay ◽

Multiple Coupling Effects Oriented Path Delay Test Generation

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.9 ◽

2008 ◽

Cited By ~ 2

Author(s):

Minjin Zhang ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Test Generation ◽

Path Delay ◽

Delay Test ◽

Coupling Effects ◽

Oriented Path ◽

Efficient Path Delay Test Generation for Custom Designs

ETRI Journal ◽

10.4218/etrij.01.0101.0306 ◽

2001 ◽

Vol 23 (3) ◽

pp. 138-150 ◽

Cited By ~ 4

Author(s):

Sungho Kang Kang ◽

Bill Underwood Underwood ◽

Wai-On Law Law ◽

Haluk Konuk Konuk

Keyword(s):

Test Generation ◽

Path Delay ◽

Delay Test ◽

Deriving logic systems for path delay test generation

IEEE Transactions on Computers ◽

10.1109/12.707585 ◽

1998 ◽

Vol 47 (8) ◽

pp. 829-846 ◽

Cited By ~ 8

Author(s):

S. Bose ◽

P. Agrawal ◽

V.D. Agrawal

Keyword(s):

Test Generation ◽

Path Delay ◽

Delay Test ◽

Logic Systems ◽

Diagnosis of small delay defects arising due to manufacturing imperfections using path delay measurements

International Symposium on Quality Electronic Design (ISQED) ◽

10.1109/isqed.2013.6523655 ◽

2013 ◽

Cited By ~ 5

Author(s):

A. M. Somashekar ◽

S. Tragoudas

Keyword(s):

Path Delay ◽

Small Delay Defects ◽

Small Delay ◽

Timing-based delay test for screening small delay defects

2006 43rd ACM/IEEE Design Automation Conference ◽

10.1145/1146909.1146993 ◽

2006 ◽

Cited By ~ 43

Author(s):

Nisar Ahmed ◽

Mohammad Tehranipoor ◽

Vinay Jayaram

Keyword(s):

Delay Test ◽

Small Delay Defects ◽

Small Delay ◽

Path delay test generation at functional level

IET Computers & Digital Techniques ◽

10.1049/iet-cdt.2013.0096 ◽

2015 ◽

Vol 9 (3) ◽

pp. 135-141 ◽

Cited By ~ 1

Author(s):

Eduardas Bareisa ◽

Vacius Jusas ◽

Kestutis Motiejunas ◽

Rimantas Seinauskas

Keyword(s):

Test Generation ◽

Path Delay ◽

Delay Test ◽

Functional Level ◽

Compact Test Generation for Small-Delay Defects Using Testable-Path Information

2009 Asian Test Symposium ◽

10.1109/ats.2009.44 ◽

2009 ◽

Author(s):

Dong Xiang ◽

Boxue Yin ◽

Krishendu Chakrabarty

Keyword(s):

Test Generation ◽

Small Delay Defects ◽

Path Information ◽

Small Delay ◽

Delay Defects ◽

Compact Test