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Delay Test and Small-Delay Defects
Test and Diagnosis for Small-Delay Defects
◽
10.1007/978-1-4419-8297-1_2
◽
2011
◽
pp. 21-36
◽
Cited By ~ 5
Author(s):
Mohammad Tehranipoor
◽
Ke Peng
◽
Krishnendu Chakrabarty
Keyword(s):
Delay Test
◽
Small Delay Defects
◽
Small Delay
◽
Delay Defects
Download Full-text
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References
Timing-based delay test for screening small delay defects
2006 43rd ACM/IEEE Design Automation Conference
◽
10.1145/1146909.1146993
◽
2006
◽
Cited By ~ 43
Author(s):
Nisar Ahmed
◽
Mohammad Tehranipoor
◽
Vinay Jayaram
Keyword(s):
Delay Test
◽
Small Delay Defects
◽
Small Delay
◽
Delay Defects
Download Full-text
Exploiting path delay test generation to develop better TDF tests for small delay defects
2017 IEEE International Test Conference (ITC)
◽
10.1109/test.2017.8242072
◽
2017
◽
Cited By ~ 3
Author(s):
Ankush Srivastava
◽
Adit D Singh
◽
Virendra Singh
◽
Kewal K Saluja
Keyword(s):
Test Generation
◽
Path Delay
◽
Delay Test
◽
Small Delay Defects
◽
Small Delay
◽
Delay Defects
◽
Path Delay Test
Download Full-text
Timing-based delay test for screening small delay defects
2006 43rd ACM/IEEE Design Automation Conference
◽
10.1109/dac.2006.229261
◽
2006
◽
Cited By ~ 10
Author(s):
N. Ahmed
◽
M. Tehranipoor
◽
V. Jayaram
Keyword(s):
Delay Test
◽
Small Delay Defects
◽
Small Delay
◽
Delay Defects
Download Full-text
Tolerance to Small Delay Defects by Adaptive Clock Stretching
13th IEEE International On-Line Testing Symposium (IOLTS 2007)
◽
10.1109/iolts.2007.67
◽
2007
◽
Cited By ~ 4
Author(s):
Swaroop Ghosh
◽
Patrick N Dai
◽
Swarup Bhunia
◽
Kaushik Roy
Keyword(s):
Small Delay Defects
◽
Small Delay
◽
Delay Defects
Download Full-text
A Novel Test Generation Method for Small-Delay Defects with User-Defined Fault Model
2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
◽
10.1109/vlsi-dat.2019.8741773
◽
2019
◽
Author(s):
Chao-Jun Shang
◽
Cheng-Hung Wu
◽
Kuen-Jong Lee
◽
Yu-Hsiang Chen
Keyword(s):
Test Generation
◽
Fault Model
◽
Small Delay Defects
◽
Small Delay
◽
Delay Defects
Download Full-text
AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects
2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems
◽
10.1109/dft.2010.48
◽
2010
◽
Cited By ~ 2
Author(s):
Tsung-Yeh Li
◽
Shi-Yu Huang
◽
Hsuan-Jung Hsu
◽
Chao-Wen Tzeng
◽
Chih-Tsun Huang
◽
...
Keyword(s):
Test Methodology
◽
Small Delay Defects
◽
Scan Test
◽
Small Delay
◽
Frequency Scan
◽
Delay Defects
Download Full-text
Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects
2008 IEEE International Test Conference
◽
10.1109/test.2008.4700627
◽
2008
◽
Cited By ~ 33
Author(s):
M. Yilmaz
◽
K. Chakrabarty
◽
M. Tehranipoor
Keyword(s):
Test Pattern
◽
Pattern Selection
◽
Small Delay Defects
◽
Small Delay
◽
Selection For
◽
Delay Defects
◽
Test Pattern Selection
Download Full-text
Graph partition based path selection for testing of small delay defects
2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC)
◽
10.1109/aspdac.2010.5419831
◽
2010
◽
Cited By ~ 1
Author(s):
Zijian He
◽
Tao Lv
◽
Huawei Li
◽
Xiaowei Li
Keyword(s):
Path Selection
◽
Graph Partition
◽
Small Delay Defects
◽
Small Delay
◽
Selection For
◽
Delay Defects
Download Full-text
A Metric to Target Small-Delay Defects in Industrial Circuits
IEEE Design & Test of Computers
◽
10.1109/mdt.2011.26
◽
2011
◽
Vol 28
(2)
◽
pp. 52-61
◽
Cited By ~ 2
Author(s):
M Yilmaz
◽
M Tehranipoor
◽
K Chakrabarty
Keyword(s):
Small Delay Defects
◽
Small Delay
◽
Delay Defects
◽
Industrial Circuits
Download Full-text
Scan Based Testing of Dual/Multi Core Processors for Small Delay Defects
2008 IEEE International Test Conference
◽
10.1109/test.2008.4700563
◽
2008
◽
Cited By ~ 10
Author(s):
A.D. Singh
Keyword(s):
Small Delay Defects
◽
Small Delay
◽
Delay Defects
Download Full-text
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