Diagnosis of small delay defects arising due to manufacturing imperfections using path delay measurements

International Symposium on Quality Electronic Design (ISQED) ◽

10.1109/isqed.2013.6523655 ◽

2013 ◽

Author(s):

A. M. Somashekar ◽

S. Tragoudas

Keyword(s):

Small Delay Defects ◽

Small Delay ◽

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Exploiting path delay test generation to develop better TDF tests for small delay defects

2017 IEEE International Test Conference (ITC) ◽

10.1109/test.2017.8242072 ◽

2017 ◽

Author(s):

Ankush Srivastava ◽

Adit D Singh ◽

Virendra Singh ◽

Kewal K Saluja

Keyword(s):

Test Generation ◽

Small Delay Defects ◽

Small Delay ◽

Delay Defects ◽

Path Delay Test

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Tolerance to Small Delay Defects by Adaptive Clock Stretching

13th IEEE International On-Line Testing Symposium (IOLTS 2007) ◽

10.1109/iolts.2007.67 ◽

2007 ◽

Author(s):

Swaroop Ghosh ◽

Patrick N Dai ◽

Swarup Bhunia ◽

Kaushik Roy

Keyword(s):

Small Delay Defects ◽

Small Delay ◽

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A Novel Test Generation Method for Small-Delay Defects with User-Defined Fault Model

2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2019.8741773 ◽

2019 ◽

Author(s):

Chao-Jun Shang ◽

Cheng-Hung Wu ◽

Kuen-Jong Lee ◽

Yu-Hsiang Chen

Keyword(s):

Test Generation ◽

Fault Model ◽

Small Delay Defects ◽

Small Delay ◽

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Delay Test and Small-Delay Defects

Test and Diagnosis for Small-Delay Defects ◽

10.1007/978-1-4419-8297-1_2 ◽

2011 ◽

pp. 21-36 ◽

Author(s):

Mohammad Tehranipoor ◽

Ke Peng ◽

Krishnendu Chakrabarty

Keyword(s):

Small Delay Defects ◽

Small Delay ◽

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AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects

2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2010.48 ◽

2010 ◽

Author(s):

Tsung-Yeh Li ◽

Shi-Yu Huang ◽

Hsuan-Jung Hsu ◽

Chao-Wen Tzeng ◽

Chih-Tsun Huang ◽

...

Keyword(s):

Test Methodology ◽

Small Delay Defects ◽

Scan Test ◽

Small Delay ◽

Frequency Scan ◽

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Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700627 ◽

2008 ◽

Author(s):

M. Yilmaz ◽

K. Chakrabarty ◽

M. Tehranipoor

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects ◽

Test Pattern Selection

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Graph partition based path selection for testing of small delay defects

2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) ◽

10.1109/aspdac.2010.5419831 ◽

2010 ◽

Author(s):

Zijian He ◽

Tao Lv ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Path Selection ◽

Graph Partition ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

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A Metric to Target Small-Delay Defects in Industrial Circuits

IEEE Design & Test of Computers ◽

10.1109/mdt.2011.26 ◽

2011 ◽

Vol 28 (2) ◽

pp. 52-61 ◽

Author(s):

M Yilmaz ◽

M Tehranipoor ◽

K Chakrabarty

Keyword(s):

Small Delay Defects ◽

Small Delay ◽

Delay Defects ◽

Industrial Circuits

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Scan Based Testing of Dual/Multi Core Processors for Small Delay Defects

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700563 ◽

2008 ◽

Author(s):

A.D. Singh

Keyword(s):

Small Delay Defects ◽

Small Delay ◽

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Circuit Topology-Based Test Pattern Generation for Small-Delay Defects

2010 19th IEEE Asian Test Symposium ◽

10.1109/ats.2010.59 ◽

2010 ◽

Author(s):

Sandeep Kumar Goel ◽

Krishnendu Chakrabarty ◽

Mahmut Yilmaz ◽

Ke Peng ◽

Mohammad Tehranipoor

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Circuit Topology ◽

Small Delay Defects ◽

Small Delay ◽

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