A Novel Test Generation Method for Small-Delay Defects with User-Defined Fault Model

2019 ◽  
Author(s):  
Chao-Jun Shang ◽  
Cheng-Hung Wu ◽  
Kuen-Jong Lee ◽  
Yu-Hsiang Chen
Keyword(s):  
Test Generation ◽  
Fault Model ◽  
Small Delay Defects ◽  
Small Delay ◽  
Delay Defects

GPU-based timing-aware test generation for small delay defects

2014 ◽  
Author(s):  
Kuan-Yu Liao ◽  
Po-Juei Chen ◽  
Ang-Feng Lin ◽  
James Chien-Mo Li ◽  
Michael S. Hsiao ◽  
...  
Keyword(s):  
Test Generation ◽  
Small Delay Defects ◽  
Small Delay ◽  
Delay Defects

Tolerance to Small Delay Defects by Adaptive Clock Stretching

2007 ◽  
Author(s):  
Swaroop Ghosh ◽  
Patrick N Dai ◽  
Swarup Bhunia ◽  
Kaushik Roy
Keyword(s):  
Small Delay Defects ◽  
Small Delay ◽  
Delay Defects

Delay Test and Small-Delay Defects

2011 ◽  
pp. 21-36 ◽  
Author(s):  
Mohammad Tehranipoor ◽  
Ke Peng ◽  
Krishnendu Chakrabarty
Keyword(s):  
Delay Test ◽  
Small Delay Defects ◽  
Small Delay ◽  
Delay Defects

AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects

2010 ◽  
Author(s):  
Tsung-Yeh Li ◽  
Shi-Yu Huang ◽  
Hsuan-Jung Hsu ◽  
Chao-Wen Tzeng ◽  
Chih-Tsun Huang ◽  
...  
Keyword(s):  
Test Methodology ◽  
Small Delay Defects ◽  
Scan Test ◽  
Small Delay ◽  
Frequency Scan ◽  
Delay Defects

A Metric to Target Small-Delay Defects in Industrial Circuits

2011 ◽  
Vol 28 (2) ◽  
pp. 52-61 ◽  
Author(s):  
M Yilmaz ◽  
M Tehranipoor ◽  
K Chakrabarty
Keyword(s):  
Small Delay Defects ◽  
Small Delay ◽  
Delay Defects ◽  
Industrial Circuits
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