A simple four-port parasitic deembedding methodology for high-frequency scattering parameter and noise characterization of SiGe HBTs

2003 ◽  
Vol 51 (11) ◽  
pp. 2165-2174 ◽  
Author(s):  
Qingqing Liang ◽  
J.D. Cressler ◽  
Guofu Niu ◽  
Yuan Lu ◽  
G. Freeman ◽  
...  
Keyword(s):  
High Frequency ◽  
Scattering Parameter ◽  
Noise Characterization

Aerodynamic Noise Characterization of a Full-Scale Wind Turbine through High-Frequency Surface Pressure Measurements

2015 ◽  
Vol 14 (5-6) ◽  
pp. 729-766 ◽  
Author(s):  
Franck Bertagnolio ◽  
Helge Aa. Madsen ◽  
Christian Bak ◽  
Niels Troldborg ◽  
Andreas Fischer
Keyword(s):  
Wind Turbine ◽  
Surface Pressure ◽  
High Frequency ◽  
Full Scale ◽  
Aerodynamic Noise ◽  
Pressure Measurements ◽  
Noise Characterization

High-frequency noise characterization of graphene field effect transistors on SiC substrates

2017 ◽  
Vol 111 (3) ◽  
pp. 033502 ◽  
Author(s):  
C. Yu ◽  
Z. Z. He ◽  
X. B. Song ◽  
Q. B. Liu ◽  
S. B. Dun ◽  
...  
Keyword(s):  
High Frequency ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Frequency Noise ◽  
High Frequency Noise ◽  
Noise Characterization

Characterization of Ni/γ-Al2O3 Catalyst Prepared by Atmospheric High Frequency Cold Plasma Jet for CO2 Reforming of CH4

2010 ◽  
Vol 31 (3) ◽  
pp. 353-359
Author(s):  
Xiaoyan CHAI ◽  
Shuyong SHANG ◽  
Gaihuan LIU ◽  
Xumei TAO ◽  
Xiang LI ◽  
...  
Keyword(s):  
High Frequency ◽  
Cold Plasma ◽  
Plasma Jet

Noise Characterization of InAs Based Composite Channel DG -MOSHEMT with Different Gate Dielectrics

Silicon ◽  
2021 ◽  
Author(s):  
G. Sujatha ◽  
N. Mohankumar ◽  
R. Poornachandran ◽  
R. Saravana Kumar ◽  
Girish Shankar Mishra ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
Composite Channel ◽  
Noise Characterization
Sign in / Sign up

Export Citation Format

Share Document