Total Ionizing Dose Influence on the Single Event Effect Sensitivity in Samsung 8Gb NAND Flash Memories
2017 ◽
Vol 64
(8)
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pp. 2046-2053
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Keyword(s):
2019 ◽
Vol 66
(1)
◽
pp. 48-53
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Keyword(s):
2013 ◽
Vol 29
(1)
◽
pp. 015010
◽
2013 ◽
Vol 28
(5)
◽
pp. 055003
Keyword(s):
2015 ◽
Vol 62
(4)
◽
pp. 1516-1527
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