scholarly journals Heavy Ion Induced Degradation in SiC Schottky Diodes: Incident Angle and Energy Deposition Dependence

2017 ◽  
pp. 1-1 ◽  
Author(s):  
Arto Javanainen ◽  
Marek Turowski ◽  
Kenneth F. Galloway ◽  
Christopher Nicklaw ◽  
Veronique Ferlet-Cavrois ◽  
...  
Keyword(s):  
Energy Deposition ◽  
Incident Angle ◽  
Schottky Diodes ◽  
Heavy Ion

scholarly journals Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence

2017 ◽  
Vol 64 (1) ◽  
pp. 415-420 ◽  
Author(s):  
Arto Javanainen ◽  
Kenneth F. Galloway ◽  
Christopher Nicklaw ◽  
Alexandre L. Bosser ◽  
Veronique Ferlet-Cavrois ◽  
...  
Keyword(s):  
Energy Deposition ◽  
Schottky Diodes ◽  
Heavy Ion

scholarly journals Design, development, and testing of non-intercepting profile diagnostics for intense heavy ion beams using a capacitive pickup and beam induced gas fluorescence monitors

2006 ◽  
Vol 24 (4) ◽  
pp. 541-551 ◽  
Author(s):  
F. BECKER ◽  
A. HUG ◽  
P. FORCK ◽  
M. KULISH ◽  
P. NI ◽  
...  
Keyword(s):  
Focal Plane ◽  
Energy Deposition ◽  
Ion Beam ◽  
Heavy Ion ◽  
High Energy ◽  
Ion Beams ◽  
High Energy Density ◽  
Design Development ◽  
Heavy Ion Beam ◽  
Beam Parameters

An intense and focused heavy ion beam is a suitable tool to generate high energy density in matter. To compare results with simulations it is essential to know beam parameters as intensity, longitudinal, and transversal profile at the focal plane. Since the beam's energy deposition will melt and evaporate even tungsten, non-intercepting diagnostics are required. Therefore a capacitive pickup with high resolution in both time and space was designed, built and tested at the high temperature experimental area at GSI. Additionally a beam induced fluorescence monitor was investigated for the synchrotron's (SIS-18) energy-regime (60–750 AMeV) and successfully tested in a beam-transfer-line.

scholarly journals Trends in heavy ion interaction with plasma

2012 ◽  
Vol 30 (4) ◽  
pp. 679-706 ◽  
Author(s):  
Yongtao Zhao ◽  
Zhanghu Hu ◽  
Rui Cheng ◽  
Yuyu Wang ◽  
Haibo Peng ◽  
...  
Keyword(s):  
Energy Deposition ◽  
Ion Beam ◽  
Heavy Ion ◽  
High Energy ◽  
Highly Charged Ions ◽  
Plasma Interaction ◽  
Current Trends ◽  
Beam Plasma ◽  
Charged Ions ◽  
Review Current

AbstractIn this work, we review current trends in China to investigate beam plasma interaction phenomena. Recent progresses in China on low energy heavy ions and plasma interaction, ion beam-plasma interactions under the influences of magnetic fields, high energy heavy ion radiography through marginal range method, energy deposition of highly charged ions on surfaces and Raman spectroscopy of surfaces after irradiation of highly charged ions are presented.

scholarly journals Failure Analysis of Heavy Ion-Irradiated Schottky Diodes

2018 ◽  
Vol 65 (1) ◽  
pp. 269-279 ◽  
Author(s):  
Megan C. Casey ◽  
Jean-Marie Lauenstein ◽  
Ronald J. Weachock ◽  
Edward P. Wilcox ◽  
Lang M. Hua ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Schottky Diodes ◽  
Heavy Ion
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